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Hidong Kwak
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Spectral matching based calibration
Patent number
10,088,413
Issue date
Oct 2, 2018
KLA-Tencor Corporation
Hidong Kwak
G01 - MEASURING TESTING
Information
Patent Grant
Single wavelength ellipsometry with improved spot size capability
Patent number
9,574,992
Issue date
Feb 21, 2017
KLA-Tencor Corporation
Esen Salcin
G01 - MEASURING TESTING
Information
Patent Grant
Atmospheric molecular contamination control with local purging
Patent number
9,110,020
Issue date
Aug 18, 2015
KLA-Tencor Corporation
Hidong Kwak
B08 - CLEANING
Information
Patent Grant
Multi-analyzer angle spectroscopic ellipsometry
Patent number
9,046,474
Issue date
Jun 2, 2015
KLA-Tencor Corporation
Hidong Kwak
G01 - MEASURING TESTING
Information
Patent Grant
Multi-analyzer angle spectroscopic ellipsometry
Patent number
9,007,583
Issue date
Apr 14, 2015
KLA-Tencor Corporation
Hidong Kwak
G01 - MEASURING TESTING
Information
Patent Grant
Atmospheric molecular contamination control with local purging
Patent number
8,830,486
Issue date
Sep 9, 2014
KLA-Tencor Corporation
Hidong Kwak
B08 - CLEANING
Information
Patent Grant
Measurement systems configured to perform measurements of a specime...
Patent number
7,869,040
Issue date
Jan 11, 2011
KLA-Tencor Technologies Corp.
Hidong Kwak
G01 - MEASURING TESTING
Information
Patent Grant
Purge gas flow control for high-precision film measurements using e...
Patent number
7,755,764
Issue date
Jul 13, 2010
KLA-Tencor Corporation
Hidong Kwak
G01 - MEASURING TESTING
Information
Patent Grant
Measurement systems configured to perform measurements of a specime...
Patent number
7,408,641
Issue date
Aug 5, 2008
KLA-Tencor Technologies Corp.
Hidong Kwak
G01 - MEASURING TESTING
Information
Patent Grant
Optical system for measuring samples using short wavelength radiation
Patent number
7,369,233
Issue date
May 6, 2008
KLA-Tencor Technologies Corporation
Mehrdad Nikoonahad
G01 - MEASURING TESTING
Information
Patent Grant
Time-resolved measurement technique using radiation pulses
Patent number
7,295,325
Issue date
Nov 13, 2007
KLA-Tencor Technologies Corporation
Hidong Kwak
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for preparing a sample for thin film analysis
Patent number
7,190,441
Issue date
Mar 13, 2007
KLA-Tencor Technologies Corp.
James T. McWhirter
G01 - MEASURING TESTING
Information
Patent Grant
Optical film topography and thickness measurement
Patent number
6,999,180
Issue date
Feb 14, 2006
KLA-Tencor Technologies Corporation
Gary R. Janik
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Atmospheric Molecular Contamination Control with Local Purging
Publication number
20150029494
Publication date
Jan 29, 2015
KLA-Tencor Corporation
Hidong Kwak
G01 - MEASURING TESTING
Information
Patent Application
METROLOGY SYSTEM CALIBRATION REFINEMENT
Publication number
20140340682
Publication date
Nov 20, 2014
Hidong Kwak
G01 - MEASURING TESTING
Information
Patent Application
Spectral Matching Based Calibration
Publication number
20130132021
Publication date
May 23, 2013
KLA-Tencor Corporation
Hidong Kwak
G01 - MEASURING TESTING
Information
Patent Application
MULTI-ANALYZER ANGLE SPECTROSCOPIC ELLIPSOMETRY
Publication number
20130010296
Publication date
Jan 10, 2013
KLA-Tencor Corporation
Hidong Kwak
G01 - MEASURING TESTING
Information
Patent Application
ATMOSPHERIC MOLECULAR CONTAMINATION CONTROL WITH LOCAL PURGING
Publication number
20130010311
Publication date
Jan 10, 2013
KLA-Tencor Corporation
Hidong Kwak
B08 - CLEANING
Information
Patent Application
PURGE GAS FLOW CONTROL FOR HIGH-PRECISION FILM MEASUREMENTS USING E...
Publication number
20080180698
Publication date
Jul 31, 2008
KLA-Tencor Corporation
Hidong Kwak
G01 - MEASURING TESTING
Information
Patent Application
Time-resolved measurement technique using radiation pulses
Publication number
20040207850
Publication date
Oct 21, 2004
Hidong Kwak
G01 - MEASURING TESTING
Information
Patent Application
Optical system for measuring samples using short wavelength radiation
Publication number
20040150820
Publication date
Aug 5, 2004
Mehrdad Nikoonahad
G01 - MEASURING TESTING