Hikaru KURASAWA

Person

Fujimi-machi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Object detection method, object detection apparatus, and non-transi...
- Patent number 12,293,578
- Issue date May 6, 2025
- Seiko Epson Corporation
- Hikaru Kurasawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for determining quality of inspection data using machine lea...
- Patent number 12,277,699
- Issue date Apr 15, 2025
- Seiko Epson Corporation
- Hikaru Kurasawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing method, image processing device, and information s...
- Patent number 11,412,161
- Issue date Aug 9, 2022
- Seiko Epson Corporation
- Teruyuki Nishimura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Information system and identification method
- Patent number 11,232,597
- Issue date Jan 25, 2022
- Seiko Epson Corporation
- Ryoki Watanabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Calibration apparatus and calibration curve creation method
- Patent number 11,204,314
- Issue date Dec 21, 2021
- Seiko Epson Corporation
- Hikaru Kurasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectroscopic system
- Patent number 11,079,274
- Issue date Aug 3, 2021
- Seiko Epson Corporation
- Hikaru Kurasawa
- G01 - MEASURING TESTING
Information Patent Grant
Calibration apparatus, calibration curve creation method, and indep...
- Patent number 10,852,228
- Issue date Dec 1, 2020
- Seiko Epson Corporation
- Hikaru Kurasawa
- G01 - MEASURING TESTING
Information Patent Grant
Calibration apparatus, calibration curve creation method, and indep...
- Patent number 10,488,329
- Issue date Nov 26, 2019
- Seiko Epson Corporation
- Tsukasa Eguchi
- G01 - MEASURING TESTING
Information Patent Grant
Calibration curve creating method and calibration curve creation ap...
- Patent number 9,921,201
- Issue date Mar 20, 2018
- Seiko Epson Corporation
- Yoshifumi Arai
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
EVALUATION METHOD, EVALUATION APPARATUS, AND NON-TRANSITORY COMPUTE...
- Publication number 20240273357
- Publication date Aug 15, 2024
- SEIKO EPSON CORPORATION
- Yuki URUSHIBATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LEARNING METHOD, DETERMINING METHOD, LEARNING APPARATUS, DETERMININ...
- Publication number 20230186085
- Publication date Jun 15, 2023
- SEIKO EPSON CORPORATION
- Shin NISHIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EVALUATION METHOD, EVALUATION DEVICE, AND COMPUTER PROGRAM
- Publication number 20230186047
- Publication date Jun 15, 2023
- SEIKO EPSON CORPORATION
- Hikaru KURASAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF EXECUTING CLASS CLASSIFICATION PROCESSING USING MACHINE L...
- Publication number 20230169307
- Publication date Jun 1, 2023
- SEIKO EPSON CORPORATION
- Tomomasa USUI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF EXTRACTING UNSUIITABLE AND DEFECTIVE DATA FROM PLURALITY...
- Publication number 20230162489
- Publication date May 25, 2023
- SEIKO EPSON CORPORATION
- Hikaru KURASAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REGRESSION PROCESSING DEVICE CONFIGURED TO EXECUTE REGRESSION PROCE...
- Publication number 20230161999
- Publication date May 25, 2023
- SEIKO EPSON CORPORATION
- Hikaru KURASAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CLASSIFICATION DEVICE CONFIGURED TO EXECUTE CLASSIFICATION PROCESSI...
- Publication number 20230162001
- Publication date May 25, 2023
- SEIKO EPSON CORPORATION
- Shin NISHIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF PERFORMING CLASSIFICATION PROCESSING USING MACHINE LEARNI...
- Publication number 20230056735
- Publication date Feb 23, 2023
- SEIKO EPSON CORPORATION
- Ryoki WATANABE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING QUALITY OF INSPECTION DATA USING MACHINE LEA...
- Publication number 20230005119
- Publication date Jan 5, 2023
- SEIKO EPSON CORPORATION
- Hikaru KURASAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DISCRIMINATING CLASS OF DATA TO BE DISCRIMINATED USING M...
- Publication number 20220277198
- Publication date Sep 1, 2022
- SEIKO EPSON CORPORATION
- Ryoki WATANABE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING CLASS OF DATA TO BE DETERMINED USING MACHINE...
- Publication number 20220245450
- Publication date Aug 4, 2022
- SEIKO EPSON CORPORATION
- Shin NISHIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OBJECT DETECTION METHOD, OBJECT DETECTION APPARATUS, AND NON-TRANSI...
- Publication number 20220164577
- Publication date May 26, 2022
- SEIKO EPSON CORPORATION
- Hikaru KURASAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, DEVICE, AND COMPUTER PROGRAM
- Publication number 20220164658
- Publication date May 26, 2022
- SEIKO EPSON CORPORATION
- Kana KANAZAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF EXECUTING CLASSIFICATION PROCESS USING MACHINE LEARNING M...
- Publication number 20220138526
- Publication date May 5, 2022
- SEIKO EPSON CORPORATION
- Ryoki WATANABE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINATION METHOD
- Publication number 20210381955
- Publication date Dec 9, 2021
- SEIKO EPSON CORPORATION
- Ryoki WATANABE
- G01 - MEASURING TESTING
Information Patent Application
METHOD, APPARATUS, AND NON-TEMPORARY COMPUTER-READABLE MEDIUM
- Publication number 20210374504
- Publication date Dec 2, 2021
- SEIKO EPSON CORPORATION
- Hikaru KURASAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, ARITHMETIC METHOD, AND NON-TEMPOR...
- Publication number 20210374534
- Publication date Dec 2, 2021
- SEIKO EPSON CORPORATION
- Hikaru KURASAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, APPARATUS, AND NON-TEMPORARY COMPUTER-READABLE MEDIUM
- Publication number 20210374535
- Publication date Dec 2, 2021
- SEIKO EPSON CORPORATION
- Hikaru KURASAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING METHOD, IMAGE PROCESSING DEVICE, AND INFORMATION S...
- Publication number 20210037198
- Publication date Feb 4, 2021
- SEIKO EPSON CORPORATION
- Teruyuki NISHIMURA
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY METHOD, DISPLAY DEVICE, AND INFORMATION SYSTEM
- Publication number 20200382688
- Publication date Dec 3, 2020
- SEIKO EPSON CORPORATION
- Ryoki Watanabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTROSCOPIC SYSTEM
- Publication number 20200249086
- Publication date Aug 6, 2020
- SEIKO EPSON CORPORATION
- Hikaru KURASAWA
- G01 - MEASURING TESTING
Information Patent Application
Information System And Identification Method
- Publication number 20200242808
- Publication date Jul 30, 2020
- SEIKO EPSON CORPORATION
- Ryoki WATANABE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION SYSTEM AND SPECIFYING METHOD
- Publication number 20200202509
- Publication date Jun 25, 2020
- SEIKO EPSON CORPORATION
- Hikaru KURASAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CALIBRATION APPARATUS AND CALIBRATION CURVE CREATION METHOD
- Publication number 20180088035
- Publication date Mar 29, 2018
- SEIKO EPSON CORPORATION
- Hikaru KURASAWA
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION APPARATUS, CALIBRATION CURVE CREATION METHOD, AND INDEP...
- Publication number 20180088032
- Publication date Mar 29, 2018
- SEIKO EPSON CORPORATION
- Hikaru KURASAWA
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION APPARATUS AND CALIBRATION CURVE CREATION METHOD
- Publication number 20180088033
- Publication date Mar 29, 2018
- SEIKO EPSON CORPORATION
- Hikaru KURASAWA
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION APPARATUS, CALIBRATION CURVE CREATION METHOD, AND INDEP...
- Publication number 20180088034
- Publication date Mar 29, 2018
- SEIKO EPSON CORPORATION
- Tsukasa EGUCHI
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION CURVE GENERATION METHOD, CALIBRATION CURVE GENERATION D...
- Publication number 20160103018
- Publication date Apr 14, 2016
- SEIKO EPSON CORPORATION
- Hikaru KURASAWA
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION CURVE GENERATION DEVICE, TARGET COMPONENT CALIBRATION D...
- Publication number 20160103063
- Publication date Apr 14, 2016
- SEIKO EPSON CORPORATION
- Hikaru KURASAWA
- G01 - MEASURING TESTING
Information Patent Application
TARGET COMPONENT CALIBRATION DEVICE, ELECTRONIC DEVICE, AND TARGET...
- Publication number 20160097676
- Publication date Apr 7, 2016
- SEIKO EPSON CORPORATION
- Hikaru KURASAWA
- G01 - MEASURING TESTING

Hikaru KURASAWA

Person

Patents Grantslast 30 patents

Object detection method, object detection apparatus, and non-transi...

Method for determining quality of inspection data using machine lea...

Image processing method, image processing device, and information s...

Information system and identification method

Calibration apparatus and calibration curve creation method

Spectroscopic system

Calibration apparatus, calibration curve creation method, and indep...

Calibration apparatus, calibration curve creation method, and indep...

Calibration curve creating method and calibration curve creation ap...

Patents Applicationslast 30 patents

EVALUATION METHOD, EVALUATION APPARATUS, AND NON-TRANSITORY COMPUTE...

LEARNING METHOD, DETERMINING METHOD, LEARNING APPARATUS, DETERMININ...

EVALUATION METHOD, EVALUATION DEVICE, AND COMPUTER PROGRAM

METHOD OF EXECUTING CLASS CLASSIFICATION PROCESSING USING MACHINE L...

METHOD OF EXTRACTING UNSUIITABLE AND DEFECTIVE DATA FROM PLURALITY...

REGRESSION PROCESSING DEVICE CONFIGURED TO EXECUTE REGRESSION PROCE...

CLASSIFICATION DEVICE CONFIGURED TO EXECUTE CLASSIFICATION PROCESSI...

METHOD OF PERFORMING CLASSIFICATION PROCESSING USING MACHINE LEARNI...

METHOD FOR DETERMINING QUALITY OF INSPECTION DATA USING MACHINE LEA...

METHOD FOR DISCRIMINATING CLASS OF DATA TO BE DISCRIMINATED USING M...

METHOD FOR DETERMINING CLASS OF DATA TO BE DETERMINED USING MACHINE...

OBJECT DETECTION METHOD, OBJECT DETECTION APPARATUS, AND NON-TRANSI...

METHOD, DEVICE, AND COMPUTER PROGRAM

METHOD OF EXECUTING CLASSIFICATION PROCESS USING MACHINE LEARNING M...

DETERMINATION METHOD

METHOD, APPARATUS, AND NON-TEMPORARY COMPUTER-READABLE MEDIUM

INFORMATION PROCESSING APPARATUS, ARITHMETIC METHOD, AND NON-TEMPOR...

METHOD, APPARATUS, AND NON-TEMPORARY COMPUTER-READABLE MEDIUM

IMAGE PROCESSING METHOD, IMAGE PROCESSING DEVICE, AND INFORMATION S...

DISPLAY METHOD, DISPLAY DEVICE, AND INFORMATION SYSTEM

SPECTROSCOPIC SYSTEM

Information System And Identification Method

INFORMATION SYSTEM AND SPECIFYING METHOD

CALIBRATION APPARATUS AND CALIBRATION CURVE CREATION METHOD

CALIBRATION APPARATUS, CALIBRATION CURVE CREATION METHOD, AND INDEP...

CALIBRATION APPARATUS AND CALIBRATION CURVE CREATION METHOD

CALIBRATION APPARATUS, CALIBRATION CURVE CREATION METHOD, AND INDEP...

CALIBRATION CURVE GENERATION METHOD, CALIBRATION CURVE GENERATION D...

CALIBRATION CURVE GENERATION DEVICE, TARGET COMPONENT CALIBRATION D...

TARGET COMPONENT CALIBRATION DEVICE, ELECTRONIC DEVICE, AND TARGET...