Hikaru NISHITANI

Person

Hyogo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor thin-film forming method, semiconductor device, semic...
- Patent number 9,275,855
- Issue date Mar 1, 2016
- Joled Inc
- Takahiro Kawashima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Crystallinity evaluation method, crystallinity evaluation device, a...
- Patent number 9,121,829
- Issue date Sep 1, 2015
- Joled Inc
- Takahiro Kawashima
- G01 - MEASURING TESTING
Information Patent Grant
Thin-film semiconductor device and method of manufacturing the same
- Patent number 9,112,034
- Issue date Aug 18, 2015
- Panasonic Liquid Crystal Display Co., Ltd.
- Sei Ootaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin-film transistor device
- Patent number 8,860,037
- Issue date Oct 14, 2014
- Panasonic Corporation
- Takahiro Kawashima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma display panel and its manufacturing method
- Patent number 8,018,154
- Issue date Sep 13, 2011
- Panasonic Corporation
- Yusuke Fukui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma display panel
- Patent number 7,511,428
- Issue date Mar 31, 2009
- Panasonic Corporation
- Hikaru Nishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device, liquid crystal display device, EL display dev...
- Patent number 6,906,346
- Issue date Jun 14, 2005
- Matsushita Electric Industrial Co., Ltd.
- Hikaru Nishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor thin film, method and apparatus for producing the sam...
- Patent number 6,806,498
- Issue date Oct 19, 2004
- Matsushita Electric Industrial Co., Ltd.
- Yoshinao Taketomi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor thin film, method of producing the same, apparatus fo...
- Patent number 6,528,397
- Issue date Mar 4, 2003
- Matsushita Electric Industrial Co., Ltd.
- Yoshinao Taketomi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
THIN-FILM TRANSISTOR DEVICE
- Publication number 20140209911
- Publication date Jul 31, 2014
- PANASONIC CORPORATION
- Takahiro KAWASHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THIN-FILM SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20130277678
- Publication date Oct 24, 2013
- Sei OOTAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYSTALLINITY EVALUATION METHOD, CRYSTALLINITY EVALUATION DEVICE, A...
- Publication number 20130030728
- Publication date Jan 31, 2013
- PANASONIC LIQUID CRYSTAL DISPLAY CO., LTD.
- Takahiro KAWASHIMA
- C30 - CRYSTAL GROWTH
Information Patent Application
SEMICONDUCTOR THIN-FILM FORMING METHOD, SEMICONDUCTOR DEVICE, SEMIC...
- Publication number 20130026479
- Publication date Jan 31, 2013
- PANASONIC CORPORATION
- Takahiro KAWASHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA DISPLAY PANEL AND ITS MANUFACTURING METHOD
- Publication number 20090167176
- Publication date Jul 2, 2009
- Yusuke Fukui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Plasma Display Panel and Method for Manufacturing Same
- Publication number 20080211408
- Publication date Sep 4, 2008
- Hiroyuki Yamakita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Plasma display panel
- Publication number 20060152142
- Publication date Jul 13, 2006
- Hikaru Nishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device, liquid crystal display device, semicondutor f...
- Publication number 20040248386
- Publication date Dec 9, 2004
- Hikaru Nishitani
- G02 - OPTICS
Information Patent Application
Semiconductor thin film, method and apparatus for producing the sam...
- Publication number 20030022471
- Publication date Jan 30, 2003
- Matsushita Electric Industrial Co., Ltd.
- Yoshinao Taketomi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Non-single crystal film, substrate with non-single crystal film, me...
- Publication number 20030017658
- Publication date Jan 23, 2003
- Hikaru Nishitani
- G01 - MEASURING TESTING

Hikaru NISHITANI

Person

Patents Grantslast 30 patents

Semiconductor thin-film forming method, semiconductor device, semic...

Crystallinity evaluation method, crystallinity evaluation device, a...

Thin-film semiconductor device and method of manufacturing the same

Thin-film transistor device

Plasma display panel and its manufacturing method

Plasma display panel

Semiconductor device, liquid crystal display device, EL display dev...

Semiconductor thin film, method and apparatus for producing the sam...

Semiconductor thin film, method of producing the same, apparatus fo...

Patents Applicationslast 30 patents

THIN-FILM TRANSISTOR DEVICE

THIN-FILM SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

CRYSTALLINITY EVALUATION METHOD, CRYSTALLINITY EVALUATION DEVICE, A...

SEMICONDUCTOR THIN-FILM FORMING METHOD, SEMICONDUCTOR DEVICE, SEMIC...

PLASMA DISPLAY PANEL AND ITS MANUFACTURING METHOD

Plasma Display Panel and Method for Manufacturing Same

Plasma display panel

Semiconductor device, liquid crystal display device, semicondutor f...

Semiconductor thin film, method and apparatus for producing the sam...

Non-single crystal film, substrate with non-single crystal film, me...