Hilmar Gugel

Person

Konrad-Adenauer-Strasse, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning microscope
- Patent number 11,686,930
- Issue date Jun 27, 2023
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G02 - OPTICS
Information Patent Grant
Optical device having at least one spectrally selective component
- Patent number 11,269,122
- Issue date Mar 8, 2022
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G02 - OPTICS
Information Patent Grant
Scanning microscope
- Patent number 10,775,599
- Issue date Sep 15, 2020
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G02 - OPTICS
Information Patent Grant
Acousto-optical tunable filter element
- Patent number 9,400,404
- Issue date Jul 26, 2016
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G02 - OPTICS
Information Patent Grant
Phase filters for a scanning microscope
- Patent number 9,250,429
- Issue date Feb 2, 2016
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G02 - OPTICS
Information Patent Grant
Method and device for illuminating a sample in a laser microscope
- Patent number 8,913,317
- Issue date Dec 16, 2014
- Leica Microsystems CMS GmbH
- Volker Seyfried
- G02 - OPTICS
Information Patent Grant
Pulse combiner for the various spectral colors of a supercontinuum...
- Patent number 8,879,148
- Issue date Nov 4, 2014
- Leica Microsystems CMS GmbH
- Arno Florian Warken
- G01 - MEASURING TESTING
Information Patent Grant
Acousto-optical tunable filter element
- Patent number 8,718,414
- Issue date May 6, 2014
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G02 - OPTICS
Information Patent Grant
Device and method for beam adjustment in an optical beam path
- Patent number 8,319,970
- Issue date Nov 27, 2012
- Leica Microsystems CMS GmbH
- Holger Birk
- G02 - OPTICS
Information Patent Grant
Method and apparatus for high-resolution optical scanning of a sample
- Patent number 8,263,946
- Issue date Sep 11, 2012
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G01 - MEASURING TESTING
Information Patent Grant
Method and microscope for high spatial resolution examination of sa...
- Patent number 7,903,247
- Issue date Mar 8, 2011
- Leica Microsystems CMS GmbH
- Marcus Dyba
- G01 - MEASURING TESTING
Information Patent Grant
Method for high spatial resolution examination of samples
- Patent number 7,830,506
- Issue date Nov 9, 2010
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G01 - MEASURING TESTING
Information Patent Grant
Interference microscope, and method for operating an interference m...
- Patent number 7,742,226
- Issue date Jun 22, 2010
- Leica Microsystems CMS GmbH
- Joerg Bewersdorf
- G02 - OPTICS
Information Patent Grant
Method and microscope for high spatial resolution examination of sa...
- Patent number 7,679,741
- Issue date Mar 16, 2010
- Leica Microsystems CMS GmbH
- Marcus Dyba
- G02 - OPTICS
Information Patent Grant
Method and microscope for high spatial resolution examination of sa...
- Patent number 7,646,481
- Issue date Jan 12, 2010
- Leica Microsystems CMS GmbH
- Marcus Dyba
- G01 - MEASURING TESTING
Information Patent Grant
Method and microscope for high spatial resolution examination of sa...
- Patent number 7,619,732
- Issue date Nov 17, 2009
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G02 - OPTICS
Information Patent Grant
Raster microscope
- Patent number 7,599,115
- Issue date Oct 6, 2009
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G02 - OPTICS
Information Patent Grant
Light source comprising a plurality of microstructured optical elem...
- Patent number 7,466,885
- Issue date Dec 16, 2008
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G02 - OPTICS
Information Patent Grant
Scanning microscope
- Patent number 7,433,119
- Issue date Oct 7, 2008
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G02 - OPTICS
Information Patent Grant
Phase filter
- Patent number 7,355,789
- Issue date Apr 8, 2008
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G02 - OPTICS
Information Patent Grant
Confocal 4-pi microscope and method for confocal 4-pi microscopy
- Patent number 7,333,207
- Issue date Feb 19, 2008
- Leica Microsystems CMS GmbH
- Jörg Bewersdorf
- G02 - OPTICS
Information Patent Grant
Double confocal scanning microscope
- Patent number 7,054,062
- Issue date May 30, 2006
- Leica Microsystems Heidelberg GmbH
- Johann Engelhardt
- G02 - OPTICS
Information Patent Grant
Double confocal scanning microscope
- Patent number 6,891,670
- Issue date May 10, 2005
- Leica Microsystems Heidelberg GmbH
- Hilmar Gugel
- G02 - OPTICS
Information Patent Grant
Optical arrangement provided for a spectral fanning out of a light...
- Patent number 6,801,359
- Issue date Oct 5, 2004
- Leica Microsystems Heidelberg GmbH
- Johann Engelhardt
- G01 - MEASURING TESTING
Information Patent Grant
Microscope and method for operating a microscope
- Patent number 6,798,569
- Issue date Sep 28, 2004
- Leica Microsystems Heidelberg GmbH
- Joerg Bewersdorf
- G02 - OPTICS
Information Patent Grant
Optical arrangement for illuminating objects and double—con...
- Patent number 6,570,705
- Issue date May 27, 2003
- Leica Microsystems Heidelberg GmbH
- Joerg Bewersdorf
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
BEAM SPLITTING DEVICE
- Publication number 20230288715
- Publication date Sep 14, 2023
- Leica Microsystems CMS GmbH
- Hilmar GUGEL
- G02 - OPTICS
Information Patent Application
OPTICAL APPARATUS
- Publication number 20230067865
- Publication date Mar 2, 2023
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G02 - OPTICS
Information Patent Application
SCANNING MICROSCOPE
- Publication number 20200409131
- Publication date Dec 31, 2020
- Leica Microsystems CMS GmbH
- Hilmar GUGEL
- G02 - OPTICS
Information Patent Application
SCANNING MICROSCOPE
- Publication number 20180321478
- Publication date Nov 8, 2018
- Leica Microsystems CMS GmbH
- Hilmar GUGEL
- G02 - OPTICS
Information Patent Application
OPTICAL DEVICE HAVING AT LEAST ONE SPECTRALLY SELECTIVE COMPONENT
- Publication number 20180203172
- Publication date Jul 19, 2018
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G02 - OPTICS
Information Patent Application
ACOUSTO-OPTICAL TUNABLE FILTER ELEMENT
- Publication number 20140218783
- Publication date Aug 7, 2014
- Leica Microsystems CMS GmbH
- Hilmar GUGEL
- G02 - OPTICS
Information Patent Application
Phase Filters for a Scanning Microscope
- Publication number 20120236398
- Publication date Sep 20, 2012
- Leica Microsystems CMS GmbH
- Hilmar GUGEL
- G02 - OPTICS
Information Patent Application
Pulse Combiner for the Various Spectral Colors of a Supercontinuum...
- Publication number 20120218631
- Publication date Aug 30, 2012
- Leica Microsystems CMS GmbH
- Arno Florian Warken
- G02 - OPTICS
Information Patent Application
ACOUSTO-OPTICAL TUNABLE FILTER ELEMENT
- Publication number 20120134007
- Publication date May 31, 2012
- Leica Microsystems CMS GmbH
- Hilmar GUGEL
- G02 - OPTICS
Information Patent Application
METHOD AND DEVICE FOR ILLUMINATING A SAMPLE IN A LASER MICROSCOPE
- Publication number 20110279890
- Publication date Nov 17, 2011
- Leica Microsystems CMS GmbH
- Volker Seyfried
- G02 - OPTICS
Information Patent Application
ACOUSTO-OPTICAL TUNABLE FILTER ELEMENT
- Publication number 20100134867
- Publication date Jun 3, 2010
- Leica Microsystems CMS GmbH
- Hilmar GUGEL
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR HIGH-RESOLUTION OPTICAL SCANNING OF A SAMPLE
- Publication number 20100006772
- Publication date Jan 14, 2010
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G02 - OPTICS
Information Patent Application
METHOD AND MICROSCOPE FOR HIGH SPATIAL RESOLUTION EXAMINATION OF SA...
- Publication number 20090303474
- Publication date Dec 10, 2009
- Leica Microsystems CMS GmbH
- Marcus DYBA
- G02 - OPTICS
Information Patent Application
Device and method for beam adjustment in an optical beam path
- Publication number 20080316469
- Publication date Dec 25, 2008
- Leica Microsystems CMS GmbH
- Holger Birk
- G02 - OPTICS
Information Patent Application
METHOD AND MICROSCOPE FOR HIGH SPATIAL RESOLUTION EXAMINATION OF SA...
- Publication number 20070268583
- Publication date Nov 22, 2007
- Leica Microsystems CMS GmbH
- Marcus DYBA
- G02 - OPTICS
Information Patent Application
Method for high spatial resolution examination of samples
- Publication number 20070206277
- Publication date Sep 6, 2007
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G01 - MEASURING TESTING
Information Patent Application
Method and microscope for high spatial resolution examination of sa...
- Publication number 20070206278
- Publication date Sep 6, 2007
- Leica Microsystems CMS GmbH
- Marcus DYBA
- G02 - OPTICS
Information Patent Application
METHOD AND MICROSCOPE FOR HIGH SPATIAL RESOLUTION EXAMINATION OF SA...
- Publication number 20070206276
- Publication date Sep 6, 2007
- Leica Microsystems CMS GmbH
- Hilmar GUGEL
- G02 - OPTICS
Information Patent Application
Raster microscope
- Publication number 20070053059
- Publication date Mar 8, 2007
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G02 - OPTICS
Information Patent Application
Light source comprising a plurality of microstructured optical elem...
- Publication number 20070025662
- Publication date Feb 1, 2007
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G02 - OPTICS
Information Patent Application
INTERFERENCE MICROSCOPE, AND METHOD FOR OPERATING AN INTERFERENCE M...
- Publication number 20060291043
- Publication date Dec 28, 2006
- Leica Microsystems Heidelberg GmbH
- Joerg Bewersdorf
- G02 - OPTICS
Information Patent Application
Phase filter
- Publication number 20060007535
- Publication date Jan 12, 2006
- Leica Microsystems CMS GmbH
- Hilmar Gugel
- G02 - OPTICS
Information Patent Application
Scanning microscope
- Publication number 20050078363
- Publication date Apr 14, 2005
- Leica Microsystems Heidelberg GmbH
- Hilmar Gugel
- G02 - OPTICS
Information Patent Application
Microscope having a reference specimen
- Publication number 20050078361
- Publication date Apr 14, 2005
- Leica Microsystems Heidelberg GmbH
- Joerg Bewersdorf
- G02 - OPTICS
Information Patent Application
Double confocal scanning microscope
- Publication number 20020109913
- Publication date Aug 15, 2002
- Hilmar Gugel
- G02 - OPTICS
Information Patent Application
Interference microscope, and method for operating an interference m...
- Publication number 20020105722
- Publication date Aug 8, 2002
- Joerg Bewersdorf
- G02 - OPTICS
Information Patent Application
Microscope and method for operating a microscope
- Publication number 20020105723
- Publication date Aug 8, 2002
- Joerg Bewersdorf
- G02 - OPTICS
Information Patent Application
Optical arrangement for illuminating objects and double - confocal...
- Publication number 20020034002
- Publication date Mar 21, 2002
- Leica Microsystems Heidelberg GmbH
- Joerg Bewersdorf
- G02 - OPTICS
Information Patent Application
Microscope
- Publication number 20020030886
- Publication date Mar 14, 2002
- Leica Microsystems Heidelberg GmbH
- Joerg Bewersdorf
- G02 - OPTICS
Information Patent Application
Double confocal scanning microscope
- Publication number 20010030803
- Publication date Oct 18, 2001
- Leica Microsystems Heidelberg GmbH
- Johann Engelhardt
- G02 - OPTICS

Hilmar Gugel

Person

Patents Grantslast 30 patents

Scanning microscope

Optical device having at least one spectrally selective component

Scanning microscope

Acousto-optical tunable filter element

Phase filters for a scanning microscope

Method and device for illuminating a sample in a laser microscope

Pulse combiner for the various spectral colors of a supercontinuum...

Acousto-optical tunable filter element

Device and method for beam adjustment in an optical beam path

Method and apparatus for high-resolution optical scanning of a sample

Method and microscope for high spatial resolution examination of sa...

Method for high spatial resolution examination of samples

Interference microscope, and method for operating an interference m...

Method and microscope for high spatial resolution examination of sa...

Method and microscope for high spatial resolution examination of sa...

Method and microscope for high spatial resolution examination of sa...

Raster microscope

Light source comprising a plurality of microstructured optical elem...

Scanning microscope

Phase filter

Confocal 4-pi microscope and method for confocal 4-pi microscopy

Double confocal scanning microscope

Double confocal scanning microscope

Optical arrangement provided for a spectral fanning out of a light...

Microscope and method for operating a microscope

Optical arrangement for illuminating objects and double&#x02014;con...

Patents Applicationslast 30 patents

BEAM SPLITTING DEVICE

OPTICAL APPARATUS

SCANNING MICROSCOPE

SCANNING MICROSCOPE

OPTICAL DEVICE HAVING AT LEAST ONE SPECTRALLY SELECTIVE COMPONENT

ACOUSTO-OPTICAL TUNABLE FILTER ELEMENT

Phase Filters for a Scanning Microscope

Pulse Combiner for the Various Spectral Colors of a Supercontinuum...

ACOUSTO-OPTICAL TUNABLE FILTER ELEMENT

METHOD AND DEVICE FOR ILLUMINATING A SAMPLE IN A LASER MICROSCOPE

ACOUSTO-OPTICAL TUNABLE FILTER ELEMENT

METHOD AND APPARATUS FOR HIGH-RESOLUTION OPTICAL SCANNING OF A SAMPLE

METHOD AND MICROSCOPE FOR HIGH SPATIAL RESOLUTION EXAMINATION OF SA...

Device and method for beam adjustment in an optical beam path

METHOD AND MICROSCOPE FOR HIGH SPATIAL RESOLUTION EXAMINATION OF SA...

Method for high spatial resolution examination of samples

Method and microscope for high spatial resolution examination of sa...

METHOD AND MICROSCOPE FOR HIGH SPATIAL RESOLUTION EXAMINATION OF SA...

Raster microscope

Light source comprising a plurality of microstructured optical elem...

INTERFERENCE MICROSCOPE, AND METHOD FOR OPERATING AN INTERFERENCE M...

Phase filter

Scanning microscope

Microscope having a reference specimen

Double confocal scanning microscope

Interference microscope, and method for operating an interference m...

Microscope and method for operating a microscope

Optical arrangement for illuminating objects and double - confocal...

Microscope

Double confocal scanning microscope

Optical arrangement for illuminating objects and double—con...