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Himaja H. Bhatt
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Cardiff by the Sea, CA, US
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last 30 patents
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Patent Application
APPARATUS FOR TEMPERATURE CONTROLLED ELECTRICAL AND OPTICAL PROBE F...
Publication number
20140361799
Publication date
Dec 11, 2014
QUALCOMM Incorporated
Armand Anthony Graupera
G01 - MEASURING TESTING
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Patent Application
ASSEMBLY FOR OPTICAL BACKSIDE FAILURE ANALYSIS OF FLIP-CHIPS DURING...
Publication number
20140167804
Publication date
Jun 19, 2014
QUALCOMM Incorporated
Himaja H. Bhatt
G01 - MEASURING TESTING
Information
Patent Application
ASSEMBLY FOR OPTICAL BACKSIDE FAILURE ANALYSIS OF PACKAGE-ON-PACKAG...
Publication number
20140159758
Publication date
Jun 12, 2014
QUALCOMM Incorporated
Himaja H. Bhatt
G01 - MEASURING TESTING
Information
Patent Application
ASSEMBLY FOR OPTICAL BACKSIDE FAILURE ANALYSIS OF WIRE-BONDED DEVIC...
Publication number
20120286818
Publication date
Nov 15, 2012
QUALCOMM Incorporated
Himaja H. Bhatt
G01 - MEASURING TESTING