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Himanshu J. Verma
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Saratoga, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
On-chip stuck-at fault detector and detection method
Patent number
7,865,790
Issue date
Jan 4, 2011
Xilinx, Inc.
Prabha Jairam
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit internal test circuit and method of testing by u...
Patent number
7,653,853
Issue date
Jan 26, 2010
Xilinx, Inc.
Prabha Jairam
G01 - MEASURING TESTING
Information
Patent Grant
On-chip critical path test circuit and method
Patent number
7,525,331
Issue date
Apr 28, 2009
Xilinx, Inc.
Prabha Jairam
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit internal test circuit and method of testing ther...
Patent number
7,526,694
Issue date
Apr 28, 2009
Xilinx, Inc.
Prabha Jairam
G01 - MEASURING TESTING
Information
Patent Grant
Signal adjustment for duty cycle control
Patent number
7,489,173
Issue date
Feb 10, 2009
Xilinx, Inc.
Himanshu J. Verma
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method for determining interconnect line performance within an inte...
Patent number
7,373,538
Issue date
May 13, 2008
Xilinx, Inc.
Tarek Eldin
G01 - MEASURING TESTING
Information
Patent Grant
Cross-correlation of delay line characteristics
Patent number
7,370,245
Issue date
May 6, 2008
Xilinx, Inc.
Himanshu J. Verma
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and apparatus for measuring duty cycle distortion on an inte...
Patent number
7,308,632
Issue date
Dec 11, 2007
Xilinx, Inc.
Himanshu J. Verma
G11 - INFORMATION STORAGE
Information
Patent Grant
Testing propagation delay of a shift register using a ring oscillator
Patent number
7,305,599
Issue date
Dec 4, 2007
Xilinx, Inc.
Richard D. J. Duce
G11 - INFORMATION STORAGE
Information
Patent Grant
Determining edge relationship between clock signals
Patent number
7,305,604
Issue date
Dec 4, 2007
Xilinx, Inc.
Himanshu J. Verma
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and apparatus for measuring crosstalk on a programmable logi...
Patent number
7,275,193
Issue date
Sep 25, 2007
Xilinx, Inc.
Himanshu J. Verma
G01 - MEASURING TESTING
Information
Patent Grant
Circuits and methods for analyzing timing characteristics of sequen...
Patent number
7,020,862
Issue date
Mar 28, 2006
Xilinx, Inc.
Peter H. Alfke
G01 - MEASURING TESTING
Information
Patent Grant
Circuits and methods for characterizing the speed performance of mu...
Patent number
6,850,123
Issue date
Feb 1, 2005
Xilinx, Inc.
Himanshu J. Verma
G01 - MEASURING TESTING
Information
Patent Grant
Circuits and methods for analyzing timing characteristics of sequen...
Patent number
6,734,703
Issue date
May 11, 2004
Xilinx, Inc.
Peter H. Alfke
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SOFTWARE DEFINED DEVICE VARIANTS
Publication number
20240329126
Publication date
Oct 3, 2024
Xilinx, Inc.
Dinesh D. GAITONDE
G01 - MEASURING TESTING