Himanshu VAJARIA

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Adaptive care areas for die-die inspection
- Patent number 10,997,710
- Issue date May 4, 2021
- KLA-Tencor Corporation
- Himanshu Vajaria
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Super-resolution defect review image generation through generative...
- Patent number 10,949,964
- Issue date Mar 16, 2021
- KLA Corporation
- Anuj Pandey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-step image alignment method for large offset die-die inspection
- Patent number 10,522,376
- Issue date Dec 31, 2019
- KLA-Tencor Corporation
- Jan Lauber
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Feature selection and automated process window monitoring through o...
- Patent number 10,365,639
- Issue date Jul 30, 2019
- KLA-Tencor Corporation
- Shabnam Ghadar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer and lot based hierarchical method combining customized metric...
- Patent number 10,290,088
- Issue date May 14, 2019
- KLA-Tencor Corporation
- Himanshu Vajaria
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated inline inspection and metrology using shadow-gram images
- Patent number 9,734,568
- Issue date Aug 15, 2017
- KLA-Tencor Corporation
- Himanshu Vajaria
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated image-based process monitoring and control
- Patent number 9,569,834
- Issue date Feb 14, 2017
- KLA-Tencor Corporation
- Himanshu Vajaria
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DISTANCE-BASED PRODUCT EVENT DETECTION
- Publication number 20230368131
- Publication date Nov 16, 2023
- 365 Retail Markets, LLC
- Himanshu Vajaria
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Super-Resolution Defect Review Image Generation Through Generative...
- Publication number 20200098101
- Publication date Mar 26, 2020
- KLA-Tencor Corporation
- Anuj Pandey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-STEP IMAGE ALIGNMENT METHOD FOR LARGE OFFSET DIE-DIE INSPECTION
- Publication number 20190122913
- Publication date Apr 25, 2019
- KLA-Tencor Corporation
- Jan Lauber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADAPTIVE CARE AREAS FOR DIE-DIE INSPECTION
- Publication number 20190114758
- Publication date Apr 18, 2019
- KLA-Tencor Corporation
- Himanshu Vajaria
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FEATURE SELECTION AND AUTOMATED PROCESS WINDOW MONITORING THROUGH O...
- Publication number 20170192411
- Publication date Jul 6, 2017
- KLA-Tencor Corporation
- Shabnam Ghadar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED IMAGE-BASED PROCESS MONITORING AND CONTROL
- Publication number 20160371826
- Publication date Dec 22, 2016
- KLA-Tencor Corporation
- Himanshu VAJARIA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED INLINE INSPECTION AND METROLOGY USING SHADOW-GRAM IMAGES
- Publication number 20150243018
- Publication date Aug 27, 2015
- KLA-Tencor Corporation
- Himanshu VAJARIA
- G01 - MEASURING TESTING
Information Patent Application
Wafer and Lot Based Hierarchical Method Combining Customized Metric...
- Publication number 20150234379
- Publication date Aug 20, 2015
- KLA-Tencor Corporation
- Himanshu Vajaria
- H01 - BASIC ELECTRIC ELEMENTS

Himanshu VAJARIA

Person

Patents Grantslast 30 patents

Adaptive care areas for die-die inspection

Super-resolution defect review image generation through generative...

Multi-step image alignment method for large offset die-die inspection

Feature selection and automated process window monitoring through o...

Wafer and lot based hierarchical method combining customized metric...

Automated inline inspection and metrology using shadow-gram images

Automated image-based process monitoring and control

Patents Applicationslast 30 patents

DISTANCE-BASED PRODUCT EVENT DETECTION

Super-Resolution Defect Review Image Generation Through Generative...

MULTI-STEP IMAGE ALIGNMENT METHOD FOR LARGE OFFSET DIE-DIE INSPECTION

ADAPTIVE CARE AREAS FOR DIE-DIE INSPECTION

FEATURE SELECTION AND AUTOMATED PROCESS WINDOW MONITORING THROUGH O...

AUTOMATED IMAGE-BASED PROCESS MONITORING AND CONTROL

AUTOMATED INLINE INSPECTION AND METROLOGY USING SHADOW-GRAM IMAGES

Wafer and Lot Based Hierarchical Method Combining Customized Metric...