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Hiraku Hirabayashi

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  • Tokyo, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    MAGNETIC SENSOR
    • Publication number 20240345187
    • Publication date Oct 17, 2024
    • TDK Corporation
    • Keita KAWAMORI
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR
    • Publication number 20240310460
    • Publication date Sep 19, 2024
    • TDK Corporation
    • Takehiro ISODA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR DEVICE
    • Publication number 20240280652
    • Publication date Aug 22, 2024
    • TDK Corporation
    • Norikazu OTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR
    • Publication number 20240230798
    • Publication date Jul 11, 2024
    • TDK Corporation
    • Yuta Saito
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR UNIT
    • Publication number 20240219484
    • Publication date Jul 4, 2024
    • TDK Corporation
    • Kunihiro UEDA
    • B82 - NANO-TECHNOLOGY
  • Information Patent Application

    MAGNETIC FIELD DETECTION APPARATUS AND CURRENT DETECTION APPARATUS
    • Publication number 20240210446
    • Publication date Jun 27, 2024
    • TDK Corporation
    • Norikazu OTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    POSITION DETECTION DEVICE
    • Publication number 20240210213
    • Publication date Jun 27, 2024
    • TDK Corporation
    • Tsuyoshi UMEHARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR
    • Publication number 20240201286
    • Publication date Jun 20, 2024
    • TDK Corporation
    • Norikazu OTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR
    • Publication number 20240125873
    • Publication date Apr 18, 2024
    • TDK Corporation
    • Hidekazu KOJIMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC FIELD DETECTION DEVICE
    • Publication number 20240027545
    • Publication date Jan 25, 2024
    • TDK Corporation
    • Masaki NAGATA
    • G01 - MEASURING TESTING
  • Information Patent Application

    LEAD FRAME AND ELECTRONIC COMPONENT
    • Publication number 20230402352
    • Publication date Dec 14, 2023
    • TDK Corporation
    • Kazuma YAMAWAKI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MAGNETIC SENSOR AND MAGNETIC SENSOR SYSTEM
    • Publication number 20230358828
    • Publication date Nov 9, 2023
    • TDK Corporation
    • Shunji SARUKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR DEVICE AND MAGNETIC SENSOR SYSTEM
    • Publication number 20230280420
    • Publication date Sep 7, 2023
    • TDK Corporation
    • Norikazu OTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    POSITION DETECTION DEVICE
    • Publication number 20230258473
    • Publication date Aug 17, 2023
    • TDK Corporation
    • Tsuyoshi UMEHARA
    • G02 - OPTICS
  • Information Patent Application

    SENSOR UNIT
    • Publication number 20230251331
    • Publication date Aug 10, 2023
    • TDK Corporation
    • Kunihiro UEDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR
    • Publication number 20230251333
    • Publication date Aug 10, 2023
    • TDK Corporation
    • Keisuke UCHIDA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MAGNETIC SENSOR
    • Publication number 20230243899
    • Publication date Aug 3, 2023
    • TDK Corporation
    • Yuta Saito
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR DEVICE, INVERTER APPARATUS, AND BATTERY APPARATUS
    • Publication number 20230204630
    • Publication date Jun 29, 2023
    • TDK Corporation
    • Yuta SAITO
    • G01 - MEASURING TESTING
  • Information Patent Application

    INSPECTION APPARATUS AND METHOD FOR INSPECTING MAGNETIC SENSOR
    • Publication number 20230152396
    • Publication date May 18, 2023
    • TDK Corporation
    • Kazuya WATANABE
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETORESISTIVE ELEMENT, MAGNETORESISTIVE DEVICE AND MAGNETIC SENSOR
    • Publication number 20230103619
    • Publication date Apr 6, 2023
    • TDK Corporation
    • Daichi TAKANO
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC FIELD DETECTION APPARATUS AND CURRENT DETECTION APPARATUS
    • Publication number 20230099490
    • Publication date Mar 30, 2023
    • TDK Corporation
    • Norikazu OTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR
    • Publication number 20230089204
    • Publication date Mar 23, 2023
    • TDK Corporation
    • Keisuke TAKASUGI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MAGNETIC SENSOR
    • Publication number 20230093647
    • Publication date Mar 23, 2023
    • TDK Corporation
    • Hidekazu KOJIMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR DEVICE
    • Publication number 20230088756
    • Publication date Mar 23, 2023
    • TDK Corporation
    • Norikazu OTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR
    • Publication number 20230091757
    • Publication date Mar 23, 2023
    • TDK Corporation
    • Keita KAWAMORI
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR AND CAMERA MODULE
    • Publication number 20230074404
    • Publication date Mar 9, 2023
    • TDK Corporation
    • Yohei HIROTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR, AND A CURRENT SENSOR AND POSITION DETECTION DEVICE...
    • Publication number 20230052013
    • Publication date Feb 16, 2023
    • TDK Corporation
    • Kenichi TAKANO
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR DEVICE AND MAGNETIC SENSOR SYSTEM
    • Publication number 20230008088
    • Publication date Jan 12, 2023
    • TDK Corporation
    • Norikazu OTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR, MAGNETIC ENCODER, AND LENS POSITION DETECTION DEVICE
    • Publication number 20220333953
    • Publication date Oct 20, 2022
    • TDK Corporation
    • Tsuyoshi UMEHARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR
    • Publication number 20220326320
    • Publication date Oct 13, 2022
    • TDK Corporation
    • Yuta Saito
    • G01 - MEASURING TESTING