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Hiroaki Hatanaka
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Yokohama-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Damage evaluation device and damage evaluation method
Patent number
12,105,050
Issue date
Oct 1, 2024
IHI Corporation
Yuuki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasonic flaw detection device and ultrasonic flaw detection method
Patent number
10,877,002
Issue date
Dec 29, 2020
IHI Corporation
Yuto Asaumi
G01 - MEASURING TESTING
Information
Patent Grant
Method for detecting arrangement disorder of fibers in conductive c...
Patent number
10,656,121
Issue date
May 19, 2020
IHI Corporation
Akinori Tsuda
G01 - MEASURING TESTING
Information
Patent Grant
Method for inspecting electroconductive composite material and devi...
Patent number
10,605,777
Issue date
Mar 31, 2020
IHI Corporation
Hiroki Kawai
G01 - MEASURING TESTING
Information
Patent Grant
Fiber waviness detection method and apparatus for conductive compos...
Patent number
10,132,778
Issue date
Nov 20, 2018
IHI Corporation
Akinori Tsuda
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Method for measuring height of lack of penetration and ultrasonic f...
Patent number
9,612,226
Issue date
Apr 4, 2017
IHI Infrastructure Systems Co., Ltd.
Yuji Takeda
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection apparatus and defect inspection method
Patent number
8,175,820
Issue date
May 8, 2012
IHI Corporation
Hiroaki Hatanaka
G01 - MEASURING TESTING
Information
Patent Grant
Corrosion evaluation device and corrosion evaluation method
Patent number
7,944,203
Issue date
May 17, 2011
IHI Corporation
Hiroaki Hatanaka
G01 - MEASURING TESTING
Information
Patent Grant
Ultrasonic flaw detection method and apparatus
Patent number
6,640,632
Issue date
Nov 4, 2003
Ishikawajima-Harima Heavy Industries Co., Ltd.
Hiroaki Hatanaka
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DAMAGE EVALUATION DEVICE AND DAMAGE EVALUATION METHOD
Publication number
20220381741
Publication date
Dec 1, 2022
IHI Corporation
Yuuki NAGAI
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETECTING ARRANGEMENT DISORDER OF FIBERS IN CONDUCTIVE C...
Publication number
20190079054
Publication date
Mar 14, 2019
IHI Corporation
Akinori TSUDA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR INSPECTING ELECTROCONDUCTIVE COMPOSITE MATERIAL AND DEVI...
Publication number
20190072521
Publication date
Mar 7, 2019
IHI Corporation
Hiroki KAWAI
G01 - MEASURING TESTING
Information
Patent Application
ULTRASONIC FLAW DETECTION DEVICE AND ULTRASONIC FLAW DETECTION METHOD
Publication number
20180321196
Publication date
Nov 8, 2018
IHI Corporation
Yuto ASAUMI
G01 - MEASURING TESTING
Information
Patent Application
FIBER WAVINESS DETECTION METHOD AND APPARATUS FOR CONDUCTIVE COMPOS...
Publication number
20160209365
Publication date
Jul 21, 2016
IHI Corporation
Akinori TSUDA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MEASURING HEIGHT OF LACK OF PENETRATION AND ULTRASONIC F...
Publication number
20150300992
Publication date
Oct 22, 2015
IHI Infrastructure Systems CO., Ltd.
Yuji Takeda
G01 - MEASURING TESTING
Information
Patent Application
INTERFACE INSPECTION METHOD AND APPARATUS FOR COMPOSITE STRUCTURE
Publication number
20150153313
Publication date
Jun 4, 2015
IHI INFRASTRUCTURE SYSTEMS CO., LTD.
Arisa KURASHIGE
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR EDDY-CURRENT FLAW DETECTION
Publication number
20140354274
Publication date
Dec 4, 2014
IHI Corporation
Akinori TSUDA
G01 - MEASURING TESTING
Information
Patent Application
CORROSION EVALUATION DEVICE AND CORROSION EVALUATION METHOD
Publication number
20090134867
Publication date
May 28, 2009
Hiroaki Hatanaka
G01 - MEASURING TESTING
Information
Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
Publication number
20090105967
Publication date
Apr 23, 2009
Hiroaki Hatanaka
G01 - MEASURING TESTING
Information
Patent Application
ULTRASONIC FLAW DETECTION METHOD AND APPARATUS
Publication number
20030200809
Publication date
Oct 30, 2003
Hiroaki Hatanaka
G01 - MEASURING TESTING