Membership
Tour
Register
Log in
Hiroaki Katsura
Follow
Person
Nara, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Ultrasonic flaw detection method and ultrasonic flaw detection device
Patent number
7,793,546
Issue date
Sep 14, 2010
Panasonic Corporation
Hiroaki Katsura
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR INSPECTING SEMICONDUCTOR DEVICE
Publication number
20100231253
Publication date
Sep 16, 2010
Matsushita Electric Industrial Co., Ltd.
Hiroki Kitagawa
G01 - MEASURING TESTING
Information
Patent Application
Ultrasonic Flaw Detection Method and Ultrasonic Flaw Detection Device
Publication number
20090301201
Publication date
Dec 10, 2009
Matsushita Electric Indusdtrial Co., Ltd.
Hiroaki Katsura
G01 - MEASURING TESTING
Information
Patent Application
Ultrasonic Inspection Method and Ultrasonic Inspection Device
Publication number
20080053230
Publication date
Mar 6, 2008
Hiroaki Katsura
G01 - MEASURING TESTING