Hiroaki Kita

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray fluorescence analysis system
- Patent number 10,948,438
- Issue date Mar 16, 2021
- Rigaku Corporation
- Hiroaki Kita
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer and X-ray fluorescence analyzing me...
- Patent number 8,644,450
- Issue date Feb 4, 2014
- Rigaku Corporation
- Hiroaki Kita
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing apparatus
- Patent number 8,475,044
- Issue date Jul 2, 2013
- Rigaku Corporation
- Hiroaki Kita
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing apparatus
- Patent number 6,708,121
- Issue date Mar 16, 2004
- Rigaku Industrial Corporation
- Akira Arake
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzing apparatus
- Patent number 6,438,200
- Issue date Aug 20, 2002
- Rigaku Industrial Corporation
- Hiroaki Kita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY FLUORESCENCE ANALYSIS SYSTEM
- Publication number 20210088459
- Publication date Mar 25, 2021
- Rigaku Corporation
- Hiroaki KITA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER AND X-RAY FLUORESCENCE ANALYZING ME...
- Publication number 20130101085
- Publication date Apr 25, 2013
- Rigaku Corporation
- Hiroaki Kita
- G01 - MEASURING TESTING
Information Patent Application
ANALYZING APPARATUS
- Publication number 20120093299
- Publication date Apr 19, 2012
- Rigaku Corporation
- Hiroaki KITA
- G01 - MEASURING TESTING
Information Patent Application
Analyzing apparatus
- Publication number 20020052695
- Publication date May 2, 2002
- Akira Arake
- G01 - MEASURING TESTING