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Hiroaki KOZAWA
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Omihachiman-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Chromatograph mass spectrometer
Patent number
11,988,653
Issue date
May 21, 2024
Shimadzu Corporation
Hiroaki Kozawa
G01 - MEASURING TESTING
Information
Patent Grant
Waveform processing assistance device and waveform processing assis...
Patent number
11,946,916
Issue date
Apr 2, 2024
Shimadzu Corporation
Yuki Ishikawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Peak detection method and data processing device
Patent number
11,499,950
Issue date
Nov 15, 2022
Shimadzu Corporation
Shinji Kanazawa
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for processing data
Patent number
11,321,425
Issue date
May 3, 2022
Shimadzu Corporation
Shinji Kanazawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Noise level estimation method, measurement data processing device,...
Patent number
11,187,685
Issue date
Nov 30, 2021
Shimadzu Corporation
Hiroaki Kozawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Time-of-flight mass spectrometer
Patent number
11,152,201
Issue date
Oct 19, 2021
Shimadzu Corporation
Tomoyuki Oshiro
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method, system and program for analyzing mass spectrometoric data
Patent number
11,094,399
Issue date
Aug 17, 2021
Shimadzu Corporation
Hiroaki Kozawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Peak extraction method and program
Patent number
10,928,367
Issue date
Feb 23, 2021
Shimadzu Corporation
Hiroaki Kozawa
G01 - MEASURING TESTING
Information
Patent Grant
Tandem mass spectrometer
Patent number
10,890,562
Issue date
Jan 12, 2021
Shimadzu Corporation
Hideki Yamamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
In-waveform peak end point detecting method and detecting device
Patent number
10,739,322
Issue date
Aug 11, 2020
Shimadzu Corporation
Hiroaki Kozawa
G01 - MEASURING TESTING
Information
Patent Grant
Waveform data processing device and waveform data processing program
Patent number
10,371,676
Issue date
Aug 6, 2019
Shimadzu Corporation
Hiroaki Kozawa
G01 - MEASURING TESTING
Information
Patent Grant
Noise level estimation method, measurement data processing device a...
Patent number
10,359,404
Issue date
Jul 23, 2019
Shimadzu Corporation
Hiroaki Kozawa
G01 - MEASURING TESTING
Information
Patent Grant
Peak detection method
Patent number
10,198,630
Issue date
Feb 5, 2019
Shimadzu Corporation
Akira Noda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for mass spectrometry data analysis
Patent number
9,595,426
Issue date
Mar 14, 2017
Shimadzu Corporation
Hiroaki Kozawa
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
CHROMATOGRAPH MASS SPECTROMETER
Publication number
20220236238
Publication date
Jul 28, 2022
Shimadzu Corporation
Hiroaki KOZAWA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ANALYZING DATA DETERMINED BY TWO VARIABLES
Publication number
20220237261
Publication date
Jul 28, 2022
Shimadzu Corporation
Hiroaki KOZAWA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
WAVEFORM PROCESSING ASSISTANCE DEVICE AND WAVEFORM PROCESSING ASSIS...
Publication number
20220198177
Publication date
Jun 23, 2022
Shimadzu Corporation
Yuki ISHIKAWA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
WAVEFORM PROCESSING ASSISTANCE DEVICE AND WAVEFORM PROCESSING ASSIS...
Publication number
20220146471
Publication date
May 12, 2022
Shimadzu Corporation
Yuki ISHIKAWA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
WAVEFORM PROCESSING DEVICE FOR CHROMATOGRAM AND WAVEFORM PROCESSING...
Publication number
20220107294
Publication date
Apr 7, 2022
Shimadzu Corporation
Yuki ISHIKAWA
G01 - MEASURING TESTING
Information
Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
Publication number
20210013019
Publication date
Jan 14, 2021
SHIMADZU CORPORATION
Tomoyuki OSHIRO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PEAK DETECTION METHOD AND DATA PROCESSING DEVICE
Publication number
20200378933
Publication date
Dec 3, 2020
SHIMADZU CORPORATION
Shinji KANAZAWA
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR PROCESSING DATA
Publication number
20190129917
Publication date
May 2, 2019
SHIMADZU CORPORATION
Shinji KANAZAWA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PEAK DETECTION METHOD AND DATA PROCESSING DEVICE
Publication number
20190064130
Publication date
Feb 28, 2019
SHIMADZU CORPORATION
Shinji KANAZAWA
G01 - MEASURING TESTING
Information
Patent Application
TANDEM MASS SPECTROMETER
Publication number
20180284065
Publication date
Oct 4, 2018
SHIMADZU CORPORATION
Hideki YAMAMOTO
G01 - MEASURING TESTING
Information
Patent Application
NOISE LEVEL ESTIMATION METHOD, MEASUREMENT DATA PROCESSING DEVICE A...
Publication number
20180011067
Publication date
Jan 11, 2018
SHIMADZU CORPORATION
Hiroaki KOZAWA
G01 - MEASURING TESTING
Information
Patent Application
NOISE LEVEL ESTIMATION METHOD, MEASUREMENT DATA PROCESSING DEVICE,...
Publication number
20180003683
Publication date
Jan 4, 2018
SHIMADZU CORPORATION
Hiroaki KOZAWA
G01 - MEASURING TESTING
Information
Patent Application
PEAK EXTRACTION METHOD AND PROGRAM
Publication number
20170219542
Publication date
Aug 3, 2017
Shimadzu Corporation
Hiroaki KOZAWA
G01 - MEASURING TESTING
Information
Patent Application
IN-WAVEFORM PEAK END POINT DETECTING METHOD AND DETECTING DEVICE
Publication number
20160238575
Publication date
Aug 18, 2016
SHIMADZU CORPORATION
Hiroaki KOZAWA
G01 - MEASURING TESTING
Information
Patent Application
WAVEFORM DATA PROCESSING DEVICE AND WAVEFORM DATA PROCESSING PROGRAM
Publication number
20160238576
Publication date
Aug 18, 2016
SHIMADZU CORPORATION
Hiroaki KOZAWA
G01 - MEASURING TESTING
Information
Patent Application
PEAK DETECTION METHOD
Publication number
20160224830
Publication date
Aug 4, 2016
SHIMADZU CORPORATION
Akira NODA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND SYSTEM FOR MASS SPECTROMETRY DATA ANALYSIS
Publication number
20140249766
Publication date
Sep 4, 2014
SHIMADZU CORPORATION
Hiroaki Kozawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD, SYSTEM AND PROGRAM FOR ANALYZING MASS SPECTROMETORIC DATA
Publication number
20130282304
Publication date
Oct 24, 2013
SHIMADZU CORPORATION
Hiroaki Kozawa
G06 - COMPUTING CALCULATING COUNTING