Hiroaki Matsumoto

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electron microscope and sample observation method
- Patent number 10,083,814
- Issue date Sep 25, 2018
- Hitachi High-Technologies Corporation
- Isao Nagaoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder and charged particle device
- Patent number 9,721,752
- Issue date Aug 1, 2017
- Hitachi High-Technologies Corporation
- Yasuhira Nagakubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 9,679,738
- Issue date Jun 13, 2017
- Hitachi High-Technologies Corporation
- Hiroaki Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE HOLDER FOR CHARGED PARTICLE BEAM DEVICE, AND CHARGED PARTICL...
- Publication number 20170018397
- Publication date Jan 19, 2017
- Hitachi High-Technologies Corporation
- Yuya SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
Sample Holder and Charged Particle Device
- Publication number 20160211109
- Publication date Jul 21, 2016
- Hitachi High-Technologies Corporation
- Yasuhira NAGAKUBO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope
- Publication number 20160196952
- Publication date Jul 7, 2016
- HIitachi High-Technologies Corporation
- Hiroaki MATSUMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Sample Observation Method
- Publication number 20160064183
- Publication date Mar 3, 2016
- Hitachi High-Technologies Corporation
- Isao NAGAOKI
- H01 - BASIC ELECTRIC ELEMENTS