Hiroaki MITO

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus
- Patent number 10,340,115
- Issue date Jul 2, 2019
- Hitachi High-Technologies Corporation
- Muneyuki Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,892,887
- Issue date Feb 13, 2018
- Hitachi High-Technologies Corporation
- Muneyuki Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of extracting contour lines of image data obtained by means...
- Patent number 8,994,815
- Issue date Mar 31, 2015
- Hitachi High-Technologies Corporation
- Hiroaki Mito
- G01 - MEASURING TESTING
Information Patent Grant
Image processing device and computer program for performing image p...
- Patent number 8,972,911
- Issue date Mar 3, 2015
- Hitachi High-Technologies Corporation
- Ryoichi Matsuoka
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,071,961
- Issue date Dec 6, 2011
- Hitachi High-Technologies Corporation
- Hiroaki Mito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,601,974
- Issue date Oct 13, 2009
- Hitachi High-Technologies Corporation
- Hiroaki Mito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,247,864
- Issue date Jul 24, 2007
- Hitachi High-Technologies Corporation
- Hiroaki Mito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,205,541
- Issue date Apr 17, 2007
- Hitachi High-Technologies Corporation
- Hiroaki Mito
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20190304740
- Publication date Oct 3, 2019
- Hitachi High-Technologies Corporation
- Muneyuki FUKUDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20180138010
- Publication date May 17, 2018
- Hitachi High-Technologies Corporation
- Muneyuki FUKUDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20170110285
- Publication date Apr 20, 2017
- Hitachi High-Technologies Corporation
- Muneyuki FUKUDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE PROCESSING DEVICE AND COMPUTER PROGRAM FOR PERFORMING IMAGE P...
- Publication number 20130326439
- Publication date Dec 5, 2013
- Hitachi High-Technologies Corporation
- Ryoichi Matsuoka
- G01 - MEASURING TESTING
Information Patent Application
MANAGING APPARATUS OF SEMICONDUCTOR MANUFACTURING APPARATUS AND COM...
- Publication number 20130150998
- Publication date Jun 13, 2013
- Hitachi High-Technologies Corporation
- Ryoichi Matsuoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Extracting Contour Lines of Image Data Obtained By Means...
- Publication number 20120300054
- Publication date Nov 29, 2012
- Hitachi High-Technologies Corporation
- Hiroaki Mito
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus
- Publication number 20100258739
- Publication date Oct 14, 2010
- Hitachi High-Technologies Corporation
- Hiroaki Mito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS HAVING VACUUM VESSEL
- Publication number 20080190928
- Publication date Aug 14, 2008
- Yasuo Yahagi
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus
- Publication number 20070187601
- Publication date Aug 16, 2007
- Hiroaki Mito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20070120068
- Publication date May 31, 2007
- Hiroaki Mito
- H01 - BASIC ELECTRIC ELEMENTS

Hiroaki MITO

Person

Patents Grantslast 30 patents

Charged particle beam apparatus

Charged particle beam apparatus

Method of extracting contour lines of image data obtained by means...

Image processing device and computer program for performing image p...

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam apparatus

Patents Applicationslast 30 patents

Charged Particle Beam Apparatus

Charged Particle Beam Apparatus

Charged Particle Beam Apparatus

IMAGE PROCESSING DEVICE AND COMPUTER PROGRAM FOR PERFORMING IMAGE P...

MANAGING APPARATUS OF SEMICONDUCTOR MANUFACTURING APPARATUS AND COM...

Method of Extracting Contour Lines of Image Data Obtained By Means...

Charged particle beam apparatus

APPARATUS HAVING VACUUM VESSEL

Charged particle beam apparatus

CHARGED PARTICLE BEAM APPARATUS