Hiroaki Miyoshi

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Sakai City, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray inspection device
- Patent number 10,705,032
- Issue date Jul 7, 2020
- SHARP KABUSHIKI KAISHA
- Hiroaki Miyoshi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NONDESTRUCTIVE INSPECTION APPARATUS AND NONDESTRUCTIVE INSPECTION M...
- Publication number 20200003702
- Publication date Jan 2, 2020
- Sharp Kabushiki Kaisha
- HIROAKI MIYOSHI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE
- Publication number 20190145914
- Publication date May 16, 2019
- Sharp Kabushiki Kaisha
- Hiroaki Miyoshi
- G01 - MEASURING TESTING