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Hiroaki Morikawa
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Kanagawa, JP
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last 30 patents
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Patent Grant
Measurement apparatus, program, and measurement method
Patent number
9,449,388
Issue date
Sep 20, 2016
Sony Corporation
Eiichi Tanaka
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
MEASUREMENT APPARATUS, PROGRAM, AND MEASUREMENT METHOD
Publication number
20140348411
Publication date
Nov 27, 2014
SONY CORPORATION
Eiichi Tanaka
G01 - MEASURING TESTING