Hiroaki Niimi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for mitigating oxide growth in a gate dielectric
- Patent number 10,068,771
- Issue date Sep 4, 2018
- Texas Instruments Incorporated
- Malcolm J. Bevan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
System and method for mitigating oxide growth in a gate dielectric
- Patent number 9,892,927
- Issue date Feb 13, 2018
- Texas Instruments Incorporated
- Malcolm J. Bevan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
System and method for mitigating oxide growth in a gate dielectric
- Patent number 9,779,946
- Issue date Oct 3, 2017
- Texas Instruments Incorporated
- Malcolm J. Bevan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for mitigating oxide growth in a gate dielectric
- Patent number 9,576,804
- Issue date Feb 21, 2017
- Texas Instruments Incorporated
- Malcolm J. Bevan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for mitigating oxide growth in a gate dielectric
- Patent number 9,396,951
- Issue date Jul 19, 2016
- Texas Instruments Incorporated
- Malcolm J. Bevan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for mitigating oxide growth in a gate dielectric
- Patent number 9,368,355
- Issue date Jun 14, 2016
- Texas Instruments Incorporated
- Malcolm J. Bevan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for mitigating oxide growth in a gate dielectric
- Patent number 9,337,046
- Issue date May 10, 2016
- Texas Instruments Incorporated
- Malcolm J. Bevan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for mitigating oxide growth in a gate dielectric
- Patent number 9,337,044
- Issue date May 10, 2016
- Texas Instruments Incorporated
- Malcolm J. Bevan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for mitigating oxide growth in a gate dielectric
- Patent number 9,177,806
- Issue date Nov 3, 2015
- Texas Instruments Incorporated
- Malcolm J. Bevan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for mitigating oxide growth in a gate dielectric
- Patent number 7,906,441
- Issue date Mar 15, 2011
- Texas Instruments Incorporated
- Malcolm J. Bevan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monitoring of nitrided oxide gate dielectrics by determination of a...
- Patent number 7,087,440
- Issue date Aug 8, 2006
- Texas Instruments Corporation
- April Gurba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for removal of hydrocarbon contamination on gate oxide prior...
- Patent number 6,924,239
- Issue date Aug 2, 2005
- Texas Instruments Incorporated
- Hiroaki Niimi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for mitigating oxide growth in a gate dielectric
- Patent number 6,921,703
- Issue date Jul 26, 2005
- Texas Instruments Incorporated
- Malcolm J. Bevan
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR MITIGATING OXIDE GROWTH IN A GATE DIELECTRIC
- Publication number 20180130662
- Publication date May 10, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Malcolm J. Bevan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SYSTEM AND METHOD FOR MITIGATING OXIDE GROWTH IN A GATE DIELECTRIC
- Publication number 20170170022
- Publication date Jun 15, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Malcolm J. Bevan
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SYSTEM AND METHOD FOR MITIGATING OXIDE GROWTH IN A GATE DIELECTRIC
- Publication number 20170133228
- Publication date May 11, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Malcolm J. Bevan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR MITIGATING OXIDE GROWTH IN A GATE DIELECTRIC
- Publication number 20160300722
- Publication date Oct 13, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Malcolm J. Bevan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Mitigating Oxide Growth in a Gate Dielectric
- Publication number 20160155641
- Publication date Jun 2, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Malcolm J. Bevan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Mitigating Oxide Growth in a Gate Dielectric
- Publication number 20160013061
- Publication date Jan 14, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Malcolm J. Bevan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Mitigating Oxide Growth in a Gate Dielectric
- Publication number 20160013082
- Publication date Jan 14, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Malcolm J. Bevan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Mitigating Oxide Growth in a Gate Dielectric
- Publication number 20160013083
- Publication date Jan 14, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Malcolm J. Bevan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Mitigating Oxide Growth in a Gate Dielectric
- Publication number 20110120374
- Publication date May 26, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Malcolm J. Bevan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Mitigating Oxide Growth in a Gate Dielectric
- Publication number 20080050882
- Publication date Feb 28, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Malcolm J. Bevan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method for mitigating oxide growth in a gate dielectric
- Publication number 20050221564
- Publication date Oct 6, 2005
- Malcolm J. Bevan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR REMOVAL OF HYDROCARBON CONTAMINATION ON GATE OXIDE PRIOR...
- Publication number 20050079723
- Publication date Apr 14, 2005
- Hiroaki Niimi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Monitoring of nitrided oxide gate dielectrics by determination of a...
- Publication number 20040235203
- Publication date Nov 25, 2004
- Texas Instruments, Incorporated
- April Gurba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method for mitigating oxide growth in a gate dielectric
- Publication number 20040229475
- Publication date Nov 18, 2004
- Malcolm J. Bevan
- H01 - BASIC ELECTRIC ELEMENTS

Hiroaki Niimi

Person

Patents Grantslast 30 patents

System and method for mitigating oxide growth in a gate dielectric

System and method for mitigating oxide growth in a gate dielectric

System and method for mitigating oxide growth in a gate dielectric

System and method for mitigating oxide growth in a gate dielectric

System and method for mitigating oxide growth in a gate dielectric

System and method for mitigating oxide growth in a gate dielectric

System and method for mitigating oxide growth in a gate dielectric

System and method for mitigating oxide growth in a gate dielectric

System and method for mitigating oxide growth in a gate dielectric

System and method for mitigating oxide growth in a gate dielectric

Monitoring of nitrided oxide gate dielectrics by determination of a...

Method for removal of hydrocarbon contamination on gate oxide prior...

System and method for mitigating oxide growth in a gate dielectric

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR MITIGATING OXIDE GROWTH IN A GATE DIELECTRIC

SYSTEM AND METHOD FOR MITIGATING OXIDE GROWTH IN A GATE DIELECTRIC

SYSTEM AND METHOD FOR MITIGATING OXIDE GROWTH IN A GATE DIELECTRIC

SYSTEM AND METHOD FOR MITIGATING OXIDE GROWTH IN A GATE DIELECTRIC

System and Method for Mitigating Oxide Growth in a Gate Dielectric

System and Method for Mitigating Oxide Growth in a Gate Dielectric

System and Method for Mitigating Oxide Growth in a Gate Dielectric

System and Method for Mitigating Oxide Growth in a Gate Dielectric

System and Method for Mitigating Oxide Growth in a Gate Dielectric

System and Method for Mitigating Oxide Growth in a Gate Dielectric

System and method for mitigating oxide growth in a gate dielectric

METHOD FOR REMOVAL OF HYDROCARBON CONTAMINATION ON GATE OXIDE PRIOR...

Monitoring of nitrided oxide gate dielectrics by determination of a...

System and method for mitigating oxide growth in a gate dielectric