Hiroaki Nishimine

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Test apparatus and test method
- Patent number 7,409,615
- Issue date Aug 5, 2008
- Advantest Corporation
- Hiroaki Nishimine
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Test apparatus and test method
- Publication number 20070022346
- Publication date Jan 25, 2007
- Advantest Corporation
- Hiroaki Nishimine
- G01 - MEASURING TESTING