-
-
-
SEMICONDUCTOR DEVICE
-
Publication number 20130093044
-
Publication date Apr 18, 2013
-
RENESAS ELECTRONICS CORPORATION
-
Hiroaki OHKUBO
-
G11 - INFORMATION STORAGE
-
-
SEMICONDUCTOR DEVICE
-
Publication number 20120262223
-
Publication date Oct 18, 2012
-
RENESAS ELECTRONICS CORPORATION
-
Hiroaki OHKUBO
-
G11 - INFORMATION STORAGE
-
SOLID STATE IMAGING DEVICE
-
Publication number 20120133810
-
Publication date May 31, 2012
-
RENESAS ELECTRONICS CORPORATION
-
Hiroaki OHKUBO
-
H01 - BASIC ELECTRIC ELEMENTS
-
-
-
Solid state imaging device
-
Publication number 20100308387
-
Publication date Dec 9, 2010
-
NEC Electronics Corporation
-
Hiroaki Ohkubo
-
H01 - BASIC ELECTRIC ELEMENTS
-
SEMICONDUCTOR DEVICE
-
Publication number 20100164053
-
Publication date Jul 1, 2010
-
NEC ELECTRONICS CORPORATION
-
Masayuki FURUMIYA
-
G01 - MEASURING TESTING
-
Semiconductor device
-
Publication number 20100025816
-
Publication date Feb 4, 2010
-
NEC Electronics Corporation
-
Masayuki Furumiya
-
H01 - BASIC ELECTRIC ELEMENTS
-
-
-
-
-
Solid state imaging device
-
Publication number 20070139542
-
Publication date Jun 21, 2007
-
NEC Electronics Corporation
-
Hiroaki Ohkubo
-
H01 - BASIC ELECTRIC ELEMENTS
-
-
Semiconductor device
-
Publication number 20070126113
-
Publication date Jun 7, 2007
-
NEC Electronics Corporation
-
Hiroaki Ohkubo
-
H01 - BASIC ELECTRIC ELEMENTS
-
-
Semiconductor device
-
Publication number 20070070736
-
Publication date Mar 29, 2007
-
NEC ELECTRONICS CORPORATION
-
Hiroaki Ohkubo
-
G11 - INFORMATION STORAGE
-
-
Semiconductor device
-
Publication number 20060102961
-
Publication date May 18, 2006
-
NEC ELECTRONICS CORPORATION
-
Hiroaki Ohkubo
-
H01 - BASIC ELECTRIC ELEMENTS
-
Semiconductor device
-
Publication number 20060081940
-
Publication date Apr 20, 2006
-
Hiroaki Ohkubo
-
H01 - BASIC ELECTRIC ELEMENTS
-
Semiconductor device
-
Publication number 20060076596
-
Publication date Apr 13, 2006
-
NEC ELECTRONICS CORPORATION
-
Hiroaki Ohkubo
-
H01 - BASIC ELECTRIC ELEMENTS
-
-
-
-
Integrated circuit device
-
Publication number 20050218471
-
Publication date Oct 6, 2005
-
NEC Electronics Corporation
-
Hiroaki Ohkubo
-
G01 - MEASURING TESTING
-
Integrated circuit device
-
Publication number 20050218470
-
Publication date Oct 6, 2005
-
NEC Electronics Corporation
-
Hiroaki Ohkubo
-
G01 - MEASURING TESTING
-