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Hiroaki Ohtateme
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Kanagawa, JP
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Patents Grants
last 30 patents
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Patent Grant
Wavelength characteristic measuring device and method using light h...
Patent number
6,870,618
Issue date
Mar 22, 2005
Anritsu Corporation
Takashi Sugimoto
G01 - MEASURING TESTING
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Patent Grant
Optical transmission characteristic measuring apparatus and calibra...
Patent number
6,069,697
Issue date
May 30, 2000
Anritsu Corporation
Takao Tanimoto
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Wavelength chacracteristic measuring device and method using light...
Publication number
20030142708
Publication date
Jul 31, 2003
Anritsu Corporation
Takashi Sugimoto
G01 - MEASURING TESTING