Hiroaki SHIBUE

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Output signal processing circuit for eddy current sensor and output...
- Patent number 12,123,714
- Issue date Oct 22, 2024
- Ebara Corporation
- Hiroto Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Polishing apparatus, polishing method and method for outputting vis...
- Patent number 12,083,646
- Issue date Sep 10, 2024
- Ebara Corporation
- Hiroaki Shibue
- B24 - GRINDING POLISHING
Information Patent Grant
Output signal processing circuit for eddy current sensor and output...
- Patent number 11,852,472
- Issue date Dec 26, 2023
- Ebara Corporation
- Hiroto Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic element and eddy current sensor using the same
- Patent number 11,759,912
- Issue date Sep 19, 2023
- Ebara Corporation
- Taro Takahashi
- B24 - GRINDING POLISHING
Information Patent Grant
Eddy current detection device and polishing apparatus
- Patent number 11,731,233
- Issue date Aug 22, 2023
- Ebara Corporation
- Taro Takahashi
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing apparatus
- Patent number 10,933,507
- Issue date Mar 2, 2021
- Ebara Corporation
- Taro Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of correcting film thickness measurement value, film thickne...
- Patent number 9,437,507
- Issue date Sep 6, 2016
- Ebara Corporation
- Akira Nakamura
- B24 - GRINDING POLISHING

Patents Applicationslast 30 patents

Information Patent Application
OUTPUT SIGNAL PROCESSING CIRCUIT FOR EDDY CURRENT SENSOR AND OUTPUT...
- Publication number 20240077297
- Publication date Mar 7, 2024
- EBARA CORPORATION
- Hiroto YAMADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION SIGNAL PROCESSING APPARATUS AND DETECTION SIGNAL PROCESSI...
- Publication number 20220412715
- Publication date Dec 29, 2022
- EBARA CORPORATION
- Hiroto Yamada
- B24 - GRINDING POLISHING
Information Patent Application
POLISHING APPARATUS, POLISHING METHOD AND METHOD FOR OUTPUTTING VIS...
- Publication number 20220219283
- Publication date Jul 14, 2022
- EBARA CORPORATION
- Hiroaki Shibue
- B24 - GRINDING POLISHING
Information Patent Application
EDDY CURRENT SENSOR
- Publication number 20220163484
- Publication date May 26, 2022
- EBARA CORPORATION
- Hiroto Yamada
- G01 - MEASURING TESTING
Information Patent Application
OUTPUT SIGNAL PROCESSING APPARATUS FOR EDDY CURRENT SENSOR
- Publication number 20220063056
- Publication date Mar 3, 2022
- EBARA CORPORATION
- Atsushi ABE
- G01 - MEASURING TESTING
Information Patent Application
OUTPUT SIGNAL PROCESSING CIRCUIT FOR EDDY CURRENT SENSOR AND OUTPUT...
- Publication number 20210199415
- Publication date Jul 1, 2021
- EBARA CORPORATION
- Hiroto YAMADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EDDY CURRENT DETECTION DEVICE AND POLISHING APPARATUS
- Publication number 20200147747
- Publication date May 14, 2020
- EBARA CORPORATION
- Taro Takahashi
- B24 - GRINDING POLISHING
Information Patent Application
MAGNETIC ELEMENT AND EDDY CURRENT SENSOR USING THE SAME
- Publication number 20190193242
- Publication date Jun 27, 2019
- EBARA CORPORATION
- Taro TAKAHASHI
- B24 - GRINDING POLISHING
Information Patent Application
POLISHING APPARATUS
- Publication number 20170259394
- Publication date Sep 14, 2017
- EBARA CORPORATION
- Taro TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF CORRECTING FILM THICKNESS MEASUREMENT VALUE, FILM THICKNE...
- Publication number 20150262893
- Publication date Sep 17, 2015
- EBARA CORPORATION
- Akira NAKAMURA
- G01 - MEASURING TESTING

Hiroaki SHIBUE

Person

Patents Grantslast 30 patents

Output signal processing circuit for eddy current sensor and output...

Polishing apparatus, polishing method and method for outputting vis...

Output signal processing circuit for eddy current sensor and output...

Magnetic element and eddy current sensor using the same

Eddy current detection device and polishing apparatus

Polishing apparatus

Method of correcting film thickness measurement value, film thickne...

Patents Applicationslast 30 patents

OUTPUT SIGNAL PROCESSING CIRCUIT FOR EDDY CURRENT SENSOR AND OUTPUT...

DETECTION SIGNAL PROCESSING APPARATUS AND DETECTION SIGNAL PROCESSI...

POLISHING APPARATUS, POLISHING METHOD AND METHOD FOR OUTPUTTING VIS...

EDDY CURRENT SENSOR

OUTPUT SIGNAL PROCESSING APPARATUS FOR EDDY CURRENT SENSOR

OUTPUT SIGNAL PROCESSING CIRCUIT FOR EDDY CURRENT SENSOR AND OUTPUT...

EDDY CURRENT DETECTION DEVICE AND POLISHING APPARATUS

MAGNETIC ELEMENT AND EDDY CURRENT SENSOR USING THE SAME

POLISHING APPARATUS

METHOD OF CORRECTING FILM THICKNESS MEASUREMENT VALUE, FILM THICKNE...