Hiroaki Shinohara

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Minamiashgara, JP

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Patents Grantslast 30 patents

Information Patent Grant
Surface defect inspector and method of inspecting surface defect
- Patent number 7,769,223
- Issue date Aug 3, 2010
- FUJIFILM Corporation
- Hiroaki Shinohara
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for manufacturing instant photographic film...
- Patent number 7,267,150
- Issue date Sep 11, 2007
- FUJIFILM Corporation
- Makoto Shimizu
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method of and apparatus for manufacturing instant photographic film...
- Patent number 6,576,390
- Issue date Jun 10, 2003
- Fuji Photo Film Co., Ltd.
- Makoto Shimizu
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC

Patents Applicationslast 30 patents

Information Patent Application
RADIOLOGICAL IMAGE DETECTION APPARATUS AND METHOD OF MANUFACTURING...
- Publication number 20120241627
- Publication date Sep 27, 2012
- FUJIFILM CORPORATION
- Kazuhiro NODA
- G01 - MEASURING TESTING
Information Patent Application
Surface defect inspector and method of inspecting surface defect
- Publication number 20070165941
- Publication date Jul 19, 2007
- FUJIFILM Corporation
- Hiroaki Shinohara
- G01 - MEASURING TESTING
Information Patent Application
Method of and apparatus for manufacturing instant photographic film...
- Publication number 20030208992
- Publication date Nov 13, 2003
- Fuji Photo Film Co., Ltd.
- Makoto Shimizu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY