TREA

Hiroaki Takimasa

Follow

Person

  • Ayabe-shi, JP
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Confocal measuring apparatus
    • Patent number 11,226,233
    • Issue date Jan 18, 2022
    • Omron Corporation
    • Shinya Furukawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Inclination measuring device
    • Patent number 10,830,587
    • Issue date Nov 10, 2020
    • Omron Corporation
    • Kosuke Sugiyama
    • B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Optical measurement system
    • Patent number 10,794,685
    • Issue date Oct 6, 2020
    • Omron Corporation
    • Koki Mizutani
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Confocal measurement device
    • Patent number 10,520,296
    • Issue date Dec 31, 2019
    • Omron Corporation
    • Hisayasu Morino
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measurement apparatus
    • Patent number 8,917,900
    • Issue date Dec 23, 2014
    • Omron Corporation
    • Yoshihiro Kanetani
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Displacement sensor
    • Patent number 8,805,643
    • Issue date Aug 12, 2014
    • Omron Corporation
    • Hiroaki Takimasa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Displacement sensor
    • Patent number 8,773,668
    • Issue date Jul 8, 2014
    • Omron Corporation
    • Yusuke Iida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Displacement sensor
    • Patent number 8,111,407
    • Issue date Feb 7, 2012
    • Omron Corporation
    • Hiroaki Takimasa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Displacement sensor
    • Patent number 8,107,088
    • Issue date Jan 31, 2012
    • Omron Corporation
    • Takahiro Suga
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Displacement sensor
    • Patent number 8,040,529
    • Issue date Oct 18, 2011
    • Omron Corporation
    • Takahiro Okuda
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Displacement sensor
    • Patent number 6,995,849
    • Issue date Feb 7, 2006
    • Omron Corporation
    • Tetsuya Uno
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    CONFOCAL MEASUREMENT DEVICE
    • Publication number 20190101375
    • Publication date Apr 4, 2019
    • Omron Corporation
    • Hisayasu MORINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONFOCAL MEASURING APPARATUS
    • Publication number 20180252582
    • Publication date Sep 6, 2018
    • Omron Corporation
    • Shinya FURUKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL MEASUREMENT SYSTEM
    • Publication number 20180238678
    • Publication date Aug 23, 2018
    • Omron Corporation
    • Koki MIZUTANI
    • G01 - MEASURING TESTING
  • Information Patent Application

    INCLINATION MEASURING DEVICE
    • Publication number 20180216933
    • Publication date Aug 2, 2018
    • Omron Corporation
    • Kosuke SUGIYAMA
    • B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    DISPLACEMENT SENSOR
    • Publication number 20130201490
    • Publication date Aug 8, 2013
    • Yusuke Iida
    • G01 - MEASURING TESTING
  • Information Patent Application

    DISPLACEMENT SENSOR
    • Publication number 20120303317
    • Publication date Nov 29, 2012
    • Omron Corporation
    • Hiroaki TAKIMASA
    • G01 - MEASURING TESTING
  • Information Patent Application

    DISPLACEMENT SENSOR
    • Publication number 20100265519
    • Publication date Oct 21, 2010
    • OMRON CORPORATION
    • Hiroaki TAKIMASA
    • G02 - OPTICS
  • Information Patent Application

    DISPLACEMENT SENSOR
    • Publication number 20100231925
    • Publication date Sep 16, 2010
    • OMRON CORPORATION
    • Takahiro OKUDA
    • G02 - OPTICS
  • Information Patent Application

    MEASUREMENT APPARATUS
    • Publication number 20100232650
    • Publication date Sep 16, 2010
    • OMRON CORPORATION
    • Yoshihiro KANETANI
    • G02 - OPTICS
  • Information Patent Application

    DISPLACEMENT SENSOR
    • Publication number 20100171955
    • Publication date Jul 8, 2010
    • OMRON CORPORATION
    • Takahiro SUGA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Displacement sensor
    • Publication number 20030179387
    • Publication date Sep 25, 2003
    • OMRON CORPORATION
    • Tetsuya Uno
    • G01 - MEASURING TESTING