Hiroaki Takinami

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Automatic adjusting method for measuring equipment and apparatus us...
- Patent number 6,931,341
- Issue date Aug 16, 2005
- Rion Co., Ltd.
- Tomoharu Wakabayashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for automatically adjusting measuring instrument and device...
- Publication number 20040141417
- Publication date Jul 22, 2004
- Tomoharu Wakabayashi
- H03 - BASIC ELECTRONIC CIRCUITRY