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Hiroaki Tobimatsu
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Kobe-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Specimen treatment chip, specimen treatment apparatus, and specimen...
Patent number
11,325,120
Issue date
May 10, 2022
Sysmex Corporation
Ayato Tagawa
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Specimen transport apparatus, specimen measurement apparatus, speci...
Patent number
10,948,507
Issue date
Mar 16, 2021
Sysmex Corporation
Yuto Sasaki
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Grant
Specimen measurement apparatus and specimen aspiration method
Patent number
10,648,996
Issue date
May 12, 2020
SYSMEX CORPORATION
Toru Mizuhashi
G01 - MEASURING TESTING
Information
Patent Grant
Particle analyzer and particle analysis method
Patent number
9,429,509
Issue date
Aug 30, 2016
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Grant
Optical device and turbidity detection apparatus using same
Patent number
7,355,194
Issue date
Apr 8, 2008
Sysmex Corporation
Hiroaki Tobimatsu
G01 - MEASURING TESTING
Information
Patent Grant
Dispensing device and analyzing apparatus
Patent number
7,344,048
Issue date
Mar 18, 2008
SYSMEX CORPORATION
Makoto Ueda
G01 - MEASURING TESTING
Information
Patent Grant
Liquid container and an analyzer equipped therewith
Patent number
6,694,747
Issue date
Feb 24, 2004
Sysmex Corporation
Takaaki Nagai
F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Patents Applications
last 30 patents
Information
Patent Application
SPECIMEN TREATMENT CHIP, SPECIMEN TREATMENT APPARATUS, AND SPECIMEN...
Publication number
20180221881
Publication date
Aug 9, 2018
SYSMEX CORPORATION
Ayato TAGAWA
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
SPECIMEN TREATMENT CHIP, SPECIMEN TREATMENT APPARATUS, AND SPECIMEN...
Publication number
20180221878
Publication date
Aug 9, 2018
SYSMEX CORPORATION
Ayato TAGAWA
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
SPECIMEN MEASUREMENT APPARATUS AND SPECIMEN ASPIRATION METHOD
Publication number
20180180638
Publication date
Jun 28, 2018
SYSMEX CORPORATION
Toru MIZUHASHI
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN TRANSPORT APPARATUS, SPECIMEN MEASUREMENT APPARATUS, SPECI...
Publication number
20180149667
Publication date
May 31, 2018
SYSMEX CORPORATION
Yuto SASAKI
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
PARTICLE DISPERSION DEVICE AND PARTICLE DISPERSION METHOD
Publication number
20180149564
Publication date
May 31, 2018
SYSMEX CORPORATION
Hiroaki TOBIMATSU
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
SPECIMEN PRETREATMENT APPARATUS, SPECIMEN PRETREATMENT CARTRIDGE, A...
Publication number
20170247682
Publication date
Aug 31, 2017
SYSMEX CORPORATION
Yasuhiro SAKAI
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
COLUMN CARTRIDGE, COLUMN CARTRIDGES ASSEMBLY, ANALYZER, AND ANALYZI...
Publication number
20080102443
Publication date
May 1, 2008
SYSMEX CORPORATION
Masakazu FUKUDA
G01 - MEASURING TESTING
Information
Patent Application
Dispensing device and analyzing apparatus
Publication number
20050194394
Publication date
Sep 8, 2005
Makoto Ueda
G01 - MEASURING TESTING
Information
Patent Application
Optical device and turbidity detection apparatus using same
Publication number
20050156124
Publication date
Jul 21, 2005
Sysmex Corporation
Hiroaki Tobimatsu
G01 - MEASURING TESTING
Information
Patent Application
Sample analyzer, nucleic acid detector and nucleic acid detection m...
Publication number
20050042138
Publication date
Feb 24, 2005
Sysmex Corporation
Makoto Ueda
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Container for analyzer, detection container, reaction container and...
Publication number
20050042145
Publication date
Feb 24, 2005
Sysmex Corporation
Makoto Ueda
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Particle analyzer and particle analysis method
Publication number
20030143117
Publication date
Jul 31, 2003
Sysmex Corporation
Takaaki Nagai
G01 - MEASURING TESTING
Information
Patent Application
Liquid container and an analyzer equipped therewith
Publication number
20030000225
Publication date
Jan 2, 2003
Sysmex Corporation
Takaaki Nagai
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL