Hiroaki Tosa

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electric contact device for establishing an improved contact with c...
- Patent number 6,589,063
- Issue date Jul 8, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Yoshitaka Kamo
- G01 - MEASURING TESTING
Information Patent Grant
Test method of chips in a semiconductor wafer employing a test algo...
- Patent number 6,151,695
- Issue date Nov 21, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Yoshitaka Kamo
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device with test terminal and IC socket
- Patent number 5,932,891
- Issue date Aug 3, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Tatsushi Higashi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Electric contact device for establishing an improved contact with c...
- Publication number 20020025698
- Publication date Feb 28, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Yoshitaka Kamo
- G01 - MEASURING TESTING