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Hiroaki Uozumi
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Kyoto, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device having heat detecting element and insulating c...
Patent number
6,617,659
Issue date
Sep 9, 2003
Matsushita Electric Industrial Co., Ltd.
Hiroyoshi Komobuchi
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device having heat detecting element and insulating c...
Patent number
6,548,879
Issue date
Apr 15, 2003
Hiroyoshi Komobuchi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SEMICONDUCTOR DEVICE HAVING HEAT DETECTING ELEMENT AND INSULATING C...
Publication number
20030151106
Publication date
Aug 14, 2003
Matsushita Electric Industrial Co.
Hiroyoshi Komobuchi
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor device and method of manufacturing the same
Publication number
20020055203
Publication date
May 9, 2002
Hiroyoshi Komobuchi
G01 - MEASURING TESTING