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Hiroaki Waki
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Kyoto-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Mass spectrometer
Patent number
8,890,058
Issue date
Nov 18, 2014
Shimadzu Corporation
Sadao Takeuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Atmospheric pressure ionization mass spectrometer system
Patent number
7,411,185
Issue date
Aug 12, 2008
Shimadzu Corporation
Hiroaki Waki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Liquid cheromatography/mass spectrometry apparatus
Patent number
7,355,172
Issue date
Apr 8, 2008
Shimadzu Corporation
Mayumi Matsui
G01 - MEASURING TESTING
Information
Patent Grant
Preparative liquid chromatograph using plural detectors
Patent number
7,267,796
Issue date
Sep 11, 2007
Shimadzu Corporation
Hiroaki Waki
G01 - MEASURING TESTING
Information
Patent Grant
Mass spectrograph
Patent number
6,661,002
Issue date
Dec 9, 2003
Shimadzu Corporation
Hideo Satta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Liquid chromatograph mass spectrometer
Patent number
6,614,017
Issue date
Sep 2, 2003
Shimadzu Corporation
Hiroaki Waki
G01 - MEASURING TESTING
Information
Patent Grant
Mass spectrometer with multipole rod type ion lens
Patent number
6,576,898
Issue date
Jun 10, 2003
Shimadzu Corporation
Hiroaki Waki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer
Patent number
6,462,338
Issue date
Oct 8, 2002
Shimadzu Corporation
Norihito Inatsugu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrospray ionizer
Patent number
6,043,487
Issue date
Mar 28, 2000
Shimadzu Corporation
Hiroaki Waki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Cylindrical multiple-pole mass filter with CVD-deposited electrode...
Patent number
5,852,302
Issue date
Dec 22, 1998
Shimadzu Corporation
Masahiro Hiraishi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometric apparatus for use with a liquid chromatograph
Patent number
5,596,192
Issue date
Jan 21, 1997
Shimadzu Corporation
Hiroaki Waki
G01 - MEASURING TESTING
Information
Patent Grant
Quadrupole mass analyzer including spring-clamped heat sink plates
Patent number
5,459,315
Issue date
Oct 17, 1995
Shimadzu Corporation
Hiroaki Waki
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Member for use in mass spectrometer
Publication number
20190295832
Publication date
Sep 26, 2019
Shimadzu Corporation
Hiroaki Waki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass Spectrometer
Publication number
20080283742
Publication date
Nov 20, 2008
Shimadzu Corporation
Sadao Takeuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Atmospheric pressure ionization mass spectrometer system
Publication number
20060124849
Publication date
Jun 15, 2006
Shimadzu Corporation
Hiroaki Waki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Liquid cheromatography/mass spectrometry apparatus
Publication number
20060118713
Publication date
Jun 8, 2006
Shimadzu Corporation
Mayumi Matsui
G01 - MEASURING TESTING
Information
Patent Application
Preparative liquid chromatograph using plural detectors
Publication number
20040018118
Publication date
Jan 29, 2004
Shimadzu Corporation
Hiroaki Waki
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Mass spectrograph
Publication number
20020038850
Publication date
Apr 4, 2002
SHIMADZU CORPORATION
Hideo Satta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass spectrometer with multipole rod type ion lens
Publication number
20010054688
Publication date
Dec 27, 2001
SHIMADZU CORPORATION
Hiroaki Waki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Liquid chromatograph mass spectrometer
Publication number
20010025923
Publication date
Oct 4, 2001
Hiroaki Waki
G01 - MEASURING TESTING