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Hiroaki YAMAZAKI

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  • Yokohama-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Sensor and method for calibrating sensor
    • Patent number 11,906,495
    • Issue date Feb 20, 2024
    • Kabushiki Kaisha Toshiba
    • Yumi Hayashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor and sensor module
    • Patent number 11,879,753
    • Issue date Jan 23, 2024
    • Kabushiki Kaisha Toshiba
    • Yosuke Akimoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    MEMS element and electrical circuit
    • Patent number 11,837,425
    • Issue date Dec 5, 2023
    • Kabushiki Kaisha Toshiba
    • Hiroaki Yamazaki
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Sensor
    • Patent number 11,761,988
    • Issue date Sep 19, 2023
    • Kabushiki Kaisha Toshiba
    • Hiroaki Yamazaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor and sensor module
    • Patent number 11,740,214
    • Issue date Aug 29, 2023
    • Kabushiki Kaisha Toshiba
    • Yosuke Akimoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor and electric device
    • Patent number 11,719,722
    • Issue date Aug 8, 2023
    • Kabushiki Kaisha Toshiba
    • Hiroaki Yamazaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensor
    • Patent number 11,656,110
    • Issue date May 23, 2023
    • Kabushiki Kaisha Toshiba
    • Hiroaki Yamazaki
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    MEMS element and electrical circuit
    • Patent number 11,646,170
    • Issue date May 9, 2023
    • Kabushiki Kaisha Toshiba
    • Hiroaki Yamazaki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Sensor and electric device
    • Patent number 11,639,946
    • Issue date May 2, 2023
    • Kabushiki Kaisha Toshiba
    • Hiroaki Yamazaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Hydrogen sensor, hydrogen detecting method, and non-transitory comp...
    • Patent number 11,624,721
    • Issue date Apr 11, 2023
    • Kabushiki Kaisha Toshiba
    • Hiroaki Yamazaki
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Sensor
    • Patent number 11,598,744
    • Issue date Mar 7, 2023
    • Kabushiki Kaisha Toshiba
    • Hiroaki Yamazaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Gas sensor
    • Patent number 11,598,746
    • Issue date Mar 7, 2023
    • Kabushiki Kaisha Toshiba
    • Yumi Hayashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Sensor and sensor module
    • Patent number 11,448,628
    • Issue date Sep 20, 2022
    • Kabushiki Kaisha Toshiba
    • Naoki Hiramatsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    MEMS element fuse-like electrical circuit interrupter
    • Patent number 11,387,064
    • Issue date Jul 12, 2022
    • Kabushiki Kaisha Toshiba
    • Hiroaki Yamazaki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    MEMS element
    • Patent number 11,214,481
    • Issue date Jan 4, 2022
    • Kabushiki Kaisha Toshiba
    • Fumitaka Ishibashi
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Grant

    Pressure sensor
    • Patent number 11,169,035
    • Issue date Nov 9, 2021
    • Kabushiki Kaisha Toshiba
    • Kei Masunishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Gas sensor including sensing section for sensing predetermined phys...
    • Patent number 11,009,478
    • Issue date May 18, 2021
    • Kabushiki Kaisha Toshiba
    • Yumi Hayashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Pressure sensor
    • Patent number 10,908,035
    • Issue date Feb 2, 2021
    • Kabushiki Kaisha Toshiba
    • Kei Masunishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Gas detection device
    • Patent number 10,794,886
    • Issue date Oct 6, 2020
    • Kabushiki Kaisha Toshiba
    • Tamio Ikehashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    IC chip and method of determining a fuse to be cut off
    • Patent number 10,763,815
    • Issue date Sep 1, 2020
    • Kabushiki Kaisha Toshiba
    • Tamio Ikehashi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Gas sensor and manufacturing method of the same
    • Patent number 10,598,647
    • Issue date Mar 24, 2020
    • Kabushiki Kaisha Toshiba
    • Tamio Ikehashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Vehicle door frame
    • Patent number 10,486,508
    • Issue date Nov 26, 2019
    • Shiroki Corporation
    • Shigenobu Osawa
    • B60 - VEHICLES IN GENERAL
  • Information Patent Grant

    Gas detection device
    • Patent number 10,281,444
    • Issue date May 7, 2019
    • Kabushiki Kaisha Toshiba
    • Tamio Ikehashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Vehicle door frame
    • Patent number 10,259,297
    • Issue date Apr 16, 2019
    • Shiroki Corporation
    • Shigenobu Osawa
    • B60 - VEHICLES IN GENERAL
  • Information Patent Grant

    Device and inspection method of the same
    • Patent number 10,193,052
    • Issue date Jan 29, 2019
    • Kabushiki Kaisha Toshiba
    • Hiroaki Yamazaki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Door frame
    • Patent number 9,776,480
    • Issue date Oct 3, 2017
    • Shiroki Corporation
    • Hiroaki Yamazaki
    • B60 - VEHICLES IN GENERAL
  • Information Patent Grant

    Vehicle door frame
    • Patent number 9,656,538
    • Issue date May 23, 2017
    • Shiroki Corporation
    • Nobutaka Nakaguchi
    • B60 - VEHICLES IN GENERAL
  • Information Patent Grant

    Semiconductor device for electrical isolation using a photocoupler...
    • Patent number 9,363,023
    • Issue date Jun 7, 2016
    • Renesas Electronics Corporation
    • Hiroaki Yamazaki
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    Vehicle door
    • Patent number 9,346,339
    • Issue date May 24, 2016
    • Shiroki Corporation
    • Kenji Shimizu
    • B60 - VEHICLES IN GENERAL
  • Information Patent Grant

    Semiconductor device for electrical isolation using a photocoupler...
    • Patent number 9,225,434
    • Issue date Dec 29, 2015
    • Renesas Electronics Corporation
    • Hiroaki Yamazaki
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

  • Information Patent Application

    SENSOR AND SENSOR SYSTEM
    • Publication number 20240085360
    • Publication date Mar 14, 2024
    • Kabushiki Kaisha Toshiba
    • Yoshihiko KURUI
    • G01 - MEASURING TESTING
  • Information Patent Application

    FILTER, GAS SENSOR, AND GAS SENSOR SYSTEM
    • Publication number 20240082764
    • Publication date Mar 14, 2024
    • Kabushiki Kaisha Toshiba
    • Akira FUJIMOTO
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    DATA PROCESSING DEVICE AND GAS CONVERSION SYSTEM
    • Publication number 20240083826
    • Publication date Mar 14, 2024
    • Kabushiki Kaisha Toshiba
    • Hiroaki YAMAZAKI
    • C01 - INORGANIC CHEMISTRY
  • Information Patent Application

    SENSOR AND GAS CONVERSION SYSTEM
    • Publication number 20240077443
    • Publication date Mar 7, 2024
    • Kabushiki Kaisha Toshiba
    • Hiroaki YAMAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND SENSOR SYSTEM
    • Publication number 20240068970
    • Publication date Feb 29, 2024
    • Kabushiki Kaisha Toshiba
    • Yoshihiko KURUI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR SYSTEM AND GAS SYSTEM
    • Publication number 20240027384
    • Publication date Jan 25, 2024
    • Kabushiki Kaisha Toshiba
    • Ping WANG
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND SENSOR SYSTEM
    • Publication number 20240011961
    • Publication date Jan 11, 2024
    • Kabushiki Kaisha Toshiba
    • Yosuke AKIMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND SENSOR SYSTEM
    • Publication number 20240011959
    • Publication date Jan 11, 2024
    • Kabushiki Kaisha Toshiba
    • Yosuke AKIMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR
    • Publication number 20230288356
    • Publication date Sep 14, 2023
    • Kabushiki Kaisha Toshiba
    • Hiroaki YAMAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND SENSOR SYSTEM"
    • Publication number 20230288270
    • Publication date Sep 14, 2023
    • Kabushiki Kaisha Toshiba
    • Yoshihiko KURUI
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    ELECTROCHEMICAL DEVICE, SENSOR, AND SENSOR SYSTEM
    • Publication number 20230280306
    • Publication date Sep 7, 2023
    • Kabushiki Kaisha Toshiba
    • Akira FUJIMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    HYDROGEN SENSOR, HYDROGEN DETECTING METHOD, AND NON-TRANSITORY COMP...
    • Publication number 20230243771
    • Publication date Aug 3, 2023
    • Kabushiki Kaisha Toshiba
    • Hiroaki Yamazaki
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    SENSOR
    • Publication number 20230221269
    • Publication date Jul 13, 2023
    • Kabushiki Kaisha Toshiba
    • Ping WANG
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR
    • Publication number 20230084037
    • Publication date Mar 16, 2023
    • Kabushiki Kaisha Toshiba
    • Hiroaki YAMAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR
    • Publication number 20230077493
    • Publication date Mar 16, 2023
    • Kabushiki Kaisha Toshiba
    • Ping WANG
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    SENSOR AND ELECTRIC DEVICE
    • Publication number 20230078060
    • Publication date Mar 16, 2023
    • Kabushiki Kaisha Toshiba
    • Hiroaki YAMAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRIC DEVICE
    • Publication number 20230079378
    • Publication date Mar 16, 2023
    • Kabushiki Kaisha Toshiba
    • Hiroaki YAMAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR
    • Publication number 20220396471
    • Publication date Dec 15, 2022
    • Kabushiki Kaisha Toshiba
    • Hiroaki YAMAZAKI
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    SENSOR
    • Publication number 20220291027
    • Publication date Sep 15, 2022
    • Kabushiki Kaisha Toshiba
    • Hiroaki YAMAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR
    • Publication number 20220276192
    • Publication date Sep 1, 2022
    • Kabushiki Kaisha Toshiba
    • Yosuke AKIMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEMS ELEMENT AND ELECTRICAL CIRCUIT
    • Publication number 20220238290
    • Publication date Jul 28, 2022
    • Kabushiki Kaisha Toshiba
    • Hiroaki YAMAZAKI
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    MEMS ELEMENT AND ELECTRICAL CIRCUIT
    • Publication number 20220084767
    • Publication date Mar 17, 2022
    • Kabushiki Kaisha Toshiba
    • Hiroaki YAMAZAKI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SENSOR
    • Publication number 20220082522
    • Publication date Mar 17, 2022
    • Kabushiki Kaisha Toshiba
    • Hiroaki YAMAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND SENSOR MODULE
    • Publication number 20220018820
    • Publication date Jan 20, 2022
    • Kabushiki Kaisha Toshiba
    • Naoki HIRAMATSU
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND SENSOR MODULE
    • Publication number 20210318279
    • Publication date Oct 14, 2021
    • Kabushiki Kaisha Toshiba
    • Yosuke AKIMOTO
    • G08 - SIGNALLING
  • Information Patent Application

    SENSOR AND SENSOR MODULE
    • Publication number 20210318282
    • Publication date Oct 14, 2021
    • Kabushiki Kaisha Toshiba
    • Yosuke AKIMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEMS ELEMENT AND ELECTRICAL CIRCUIT
    • Publication number 20210175035
    • Publication date Jun 10, 2021
    • Kabushiki Kaisha Toshiba
    • Hiroaki YAMAZAKI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SENSOR AND METHOD FOR CALIBRATING SENSOR
    • Publication number 20210109071
    • Publication date Apr 15, 2021
    • Kabushiki Kaisha Toshiba
    • Yumi HAYASHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEMS ELEMENT
    • Publication number 20210047171
    • Publication date Feb 18, 2021
    • Kabushiki Kaisha Toshiba
    • Fumitaka ISHIBASHI
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    PRESSURE SENSOR
    • Publication number 20210041311
    • Publication date Feb 11, 2021
    • Kabushiki Kaisha Toshiba
    • Kei Masunishi
    • G01 - MEASURING TESTING