TREA

Hiroaki Yuda

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  • Iwate, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Wafer inspection apparatus
    • Patent number 7,149,341
    • Issue date Dec 12, 2006
    • Toshiba Ceramics Co., Ltd.
    • Yoshinori Hayashi
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Wafer inspection apparatus
    • Publication number 20030169916
    • Publication date Sep 11, 2003
    • TOSHIBA CERAMICS CO., LTD.
    • Yoshinori Hayashi
    • G01 - MEASURING TESTING