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Hiroatsu Mori
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Kawasaki-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Offset correction device and position measuring device
Patent number
11,536,590
Issue date
Dec 27, 2022
Mitutoyo Corp.
Kenichi Hayashi
G01 - MEASURING TESTING
Information
Patent Grant
Electromagnetic induction type encoder
Patent number
11,320,287
Issue date
May 3, 2022
Mitutoyo Corporation
Hiroatsu Mori
G08 - SIGNALLING
Information
Patent Grant
Electromagnetic induction type encoder
Patent number
10,809,100
Issue date
Oct 20, 2020
Mitutoyo Corporation
Hiroatsu Mori
G01 - MEASURING TESTING
Information
Patent Grant
Encoder
Patent number
10,677,614
Issue date
Jun 9, 2020
Mitutoyo Corporation
Hiroatsu Mori
G01 - MEASURING TESTING
Information
Patent Grant
Optical displacement encoder
Patent number
9,207,101
Issue date
Dec 8, 2015
Mitutoyo Corporation
Hiroatsu Mori
G01 - MEASURING TESTING
Information
Patent Grant
Photoelectric encoder and photoelectric encoder system
Patent number
8,546,746
Issue date
Oct 1, 2013
Mitutoyo Corporation
Hiroatsu Mori
G01 - MEASURING TESTING
Information
Patent Grant
Photoelectric encoder including detection head and a plurality of f...
Patent number
8,395,108
Issue date
Mar 12, 2013
Mitutoyo Corporation
Hiroatsu Mori
G01 - MEASURING TESTING
Information
Patent Grant
Elastic fixture and attachment method for length measuring apparatus
Patent number
7,356,940
Issue date
Apr 15, 2008
Mitutoyo Corporation
Hiroaki Kawada
G01 - MEASURING TESTING
Information
Patent Grant
Linear scale attachment device and attachment method
Patent number
7,225,555
Issue date
Jun 5, 2007
Mitutoyo Corporation
Hiroaki Kawada
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OFFSET CORRECTION DEVICE AND POSITION MEASURING DEVICE
Publication number
20200408570
Publication date
Dec 31, 2020
Mitutoyo Corporation
Kenichi Hayashi
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC INDUCTION TYPE ENCODER
Publication number
20200393271
Publication date
Dec 17, 2020
Mitutoyo Corporation
Hiroatsu Mori
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC INDUCTION TYPE ENCODER
Publication number
20190316936
Publication date
Oct 17, 2019
Mitutoyo Corporation
Hiroatsu Mori
G01 - MEASURING TESTING
Information
Patent Application
ENCODER
Publication number
20180292238
Publication date
Oct 11, 2018
Mitutoyo Corporation
Hiroatsu Mori
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DISPLACEMENT ENCODER
Publication number
20150276435
Publication date
Oct 1, 2015
MITUTOYO CORPORATION
Hiroatsu MORI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DISPLACEMENT ENCODER
Publication number
20140291497
Publication date
Oct 2, 2014
MITUTOYO CORPORATION
Hiroatsu MORI
G01 - MEASURING TESTING
Information
Patent Application
PHOTOELECTRIC ENCODER AND PHOTOELECTRIC ENCODER SYSTEM
Publication number
20120097843
Publication date
Apr 26, 2012
Mitutoyo Corporation
Hiroatsu Mori
G01 - MEASURING TESTING
Information
Patent Application
PHOTOELECTRIC ENCODER
Publication number
20110031382
Publication date
Feb 10, 2011
Mitutoyo Corporation
Hiroatsu Mori
G02 - OPTICS
Information
Patent Application
Elastic fixture and attachment method for length measuring apparatus
Publication number
20060016088
Publication date
Jan 26, 2006
Mitutoyo Corporation
Hiroaki Kawada
G01 - MEASURING TESTING
Information
Patent Application
Linear scale attachment device and attachment method
Publication number
20060016089
Publication date
Jan 26, 2006
Mitutoyo Corporation
Hiroaki Kawada
G01 - MEASURING TESTING