Hirobumi Musha

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Measuring apparatus and measuring method
- Patent number 7,636,387
- Issue date Dec 22, 2009
- Advantest Corporation
- Takahiro Yamaguchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Measuring apparatus and measuring method
- Patent number 7,054,358
- Issue date May 30, 2006
- Advantest Corporation
- Takahiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Frequency spectrum analyzer with high C/N ratio
- Patent number 6,265,861
- Issue date Jul 24, 2001
- Advantest Corp.
- Hirobumi Musha
- G01 - MEASURING TESTING
Information Patent Grant
Frequency spectrum analyzer with high C/N ratio
- Patent number 6,166,533
- Issue date Dec 26, 2000
- Advantest Corp.
- Hirobumi Musha
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Measuring apparatus and measuring method
- Publication number 20050031029
- Publication date Feb 10, 2005
- Takahiro Yamaguchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Measuring apparatus and measuring method
- Publication number 20030202573
- Publication date Oct 30, 2003
- Takahiro Yamaguchi
- G01 - MEASURING TESTING