Hirobumi SHIOHATA

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Automated analysis device, and abnormality detecting method
- Patent number 12,163,972
- Issue date Dec 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Hirobumi Shiohata
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Automated Analyzing Device, and Control Method for Same
- Publication number 20240353435
- Publication date Oct 24, 2024
- Hitachi High-Tech Corporation
- Hirobumi SHIOHATA
- G01 - MEASURING TESTING
Information Patent Application
Automated Analysis Device, and Abnormality Detecting Method
- Publication number 20220221477
- Publication date Jul 14, 2022
- Hitachi High-Tech Corporation
- Hirobumi SHIOHATA
- G01 - MEASURING TESTING