Hirofumi Iijima

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device and control method of optical system o...
- Patent number 11,222,764
- Issue date Jan 11, 2022
- Jeol Ltd.
- Kazuya Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope and method of controlling same
- Patent number 11,133,151
- Issue date Sep 28, 2021
- Jeol Ltd.
- Hirofumi Iijima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 10,741,358
- Issue date Aug 11, 2020
- Jeol Ltd.
- Yuko Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase plate, method of fabricating same, and electron microscope
- Patent number 9,786,467
- Issue date Oct 10, 2017
- Jeol Ltd.
- Hirofumi Iijima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compound microscope device
- Patent number 9,310,596
- Issue date Apr 12, 2016
- Inter-University Research Institute Corporation National Institute of Natural...
- Kuniaki Nagayama
- G02 - OPTICS
Information Patent Grant
Image acquisition method and transmission electron microscope
- Patent number 9,196,456
- Issue date Nov 24, 2015
- Jeol Ltd.
- Hirofumi Iijima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase plate and method of fabricating same
- Patent number 8,829,436
- Issue date Sep 9, 2014
- Jeol Ltd.
- Hirofumi Iijima
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Transmission Electron Microscope and Method of Controlling Same
- Publication number 20210151286
- Publication date May 20, 2021
- JEOL Ltd.
- Hirofumi Iijima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Control Method of Optical System o...
- Publication number 20200343072
- Publication date Oct 29, 2020
- JEOL Ltd.
- Kazuya Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope
- Publication number 20200013582
- Publication date Jan 9, 2020
- JEOL Ltd.
- Yuko Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Phase Plate, Method of Fabricating Same, and Electron Microscope
- Publication number 20160276125
- Publication date Sep 22, 2016
- JEOL Ltd.
- Hirofumi Iijima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Image Acquisition Method and Transmission Electron Microscope
- Publication number 20150136980
- Publication date May 21, 2015
- JEOL Ltd.
- Hirofumi Iijima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Phase Plate and Method of Fabricating Same
- Publication number 20140183358
- Publication date Jul 3, 2014
- JEOL Ltd.
- Hirofumi Iijima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOUND MICROSCOPE DEVICE
- Publication number 20130088775
- Publication date Apr 11, 2013
- Kuniaki Nagayama
- G02 - OPTICS