Hirofumi Kanno

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Atsugi-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Testing device comprising circuitry to calculate a correction value...
- Patent number 10,317,503
- Issue date Jun 11, 2019
- Anritsu Corporation
- Koji Yamashita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING DEVICE AND ITS CALIBRATION METHOD
- Publication number 20160077158
- Publication date Mar 17, 2016
- Anritsu Corporation
- Koji Yamashita
- G01 - MEASURING TESTING