Hirofumi Miyao

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Stage apparatus and electron beam lithography system
- Patent number 12,222,658
- Issue date Feb 11, 2025
- Jeol Ltd.
- Hirofumi Miyao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for preparing specimen
- Patent number 7,531,794
- Issue date May 12, 2009
- Jeol Ltd.
- Tadanori Yoshioka
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope
- Patent number 7,351,970
- Issue date Apr 1, 2008
- Jeol Ltd.
- Hirofumi Miyao
- G01 - MEASURING TESTING
Information Patent Grant
Specimen inspection instrument
- Patent number 6,653,629
- Issue date Nov 25, 2003
- Jeol Ltd.
- Yukihiro Tanaka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Stage Apparatus and Electron Beam Lithography System
- Publication number 20220413396
- Publication date Dec 29, 2022
- JEOL Ltd.
- Hirofumi Miyao
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Apparatus for Preparing Cross-Sectional Specimen Using Ion Beam
- Publication number 20080067443
- Publication date Mar 20, 2008
- JEOL Ltd.
- Kouji Todoroki
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for preparing specimen
- Publication number 20060255295
- Publication date Nov 16, 2006
- JEOL Ltd.
- Tadanori Yoshioka
- G01 - MEASURING TESTING
Information Patent Application
Scanning electron microscope
- Publication number 20060219911
- Publication date Oct 5, 2006
- JEOL Ltd.
- Hirofumi Miyao
- G01 - MEASURING TESTING
Information Patent Application
Specimen inspection instrument
- Publication number 20020008201
- Publication date Jan 24, 2002
- JEOL Ltd.
- Yukihiro Tanaka
- G01 - MEASURING TESTING