Hirofumi OUCHI

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Mito, JP

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Patents Grantslast 30 patents

Information Patent Grant
Eddy current flaw detection system and eddy current flaw detection...
- Patent number 9,222,915
- Issue date Dec 29, 2015
- Hitachi - GE Nuclear Energy, Ltd.
- Akira Nishimizu
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current flaw detection probe
- Patent number 8,228,058
- Issue date Jul 24, 2012
- Hitachi-GE Nuclear Energy, Ltd.
- Akira Nishimizu
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current testing device
- Patent number 8,183,862
- Issue date May 22, 2012
- Hitachi, Ltd.
- Hisashi Endo
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current flaw detection sensor and method
- Patent number 7,358,721
- Issue date Apr 15, 2008
- Hitachi, Ltd.
- Soshi Narishige
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Eddy Current Flaw Detection System and Eddy Current Flaw Detection...
- Publication number 20130193960
- Publication date Aug 1, 2013
- Hitachi-GE NUCLEAR ENERGY, LTD.
- Akira NISHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT TESTING DEVICE
- Publication number 20090230952
- Publication date Sep 17, 2009
- Hisashi Endo
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT FLAW DETECTION PROBE
- Publication number 20090009162
- Publication date Jan 8, 2009
- Akira NISHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT FLAW DETECTION SENSOR AND METHOD
- Publication number 20070229066
- Publication date Oct 4, 2007
- Soshi Narishige
- G01 - MEASURING TESTING