Hirofumi Sato

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Naka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe navigation method and device and defect inspection device
- Patent number 7,598,755
- Issue date Oct 6, 2009
- Hitachi High-Technologies Corporation
- Takashi Furukawa
- G01 - MEASURING TESTING
Information Patent Grant
Probe navigation method and device and defect inspection device
- Patent number 7,372,283
- Issue date May 13, 2008
- Hitachi High-Technologies Corporation
- Takashi Furukawa
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspecting apparatus
- Patent number 7,129,727
- Issue date Oct 31, 2006
- Hitachi High-Technologies Corporation
- Tsutomu Saito
- G01 - MEASURING TESTING
Information Patent Grant
Probe navigation method and device and defect inspection device
- Patent number 7,071,713
- Issue date Jul 4, 2006
- Hitachi High-Technologies Corpoartion
- Takashi Furukawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE NAVIGATION METHOD AND DEVICE AND DEFECT INSPECTION DEVICE
- Publication number 20080218185
- Publication date Sep 11, 2008
- Takashi Furukawa
- G01 - MEASURING TESTING
Information Patent Application
Probe navigation method and device and defect inspection device
- Publication number 20060192574
- Publication date Aug 31, 2006
- Takashi Furukawa
- G01 - MEASURING TESTING
Information Patent Application
Defect inspecting apparatus
- Publication number 20060087330
- Publication date Apr 27, 2006
- Hitachi High-Technologies Corporation
- Tsutomu Saito
- G01 - MEASURING TESTING
Information Patent Application
Probe navigation method and device and defect inspection device
- Publication number 20050140379
- Publication date Jun 30, 2005
- Takashi Furukawa
- G01 - MEASURING TESTING