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Hirofumi Shimamoto
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for irradiating laser
Patent number
7,920,277
Issue date
Apr 5, 2011
NEC Corporation
Mitsuru Nakata
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for irradiating laser
Patent number
7,724,382
Issue date
May 25, 2010
NEC Corporation
Mitsuru Nakata
G01 - MEASURING TESTING
Information
Patent Grant
Thin film transistor substrate with low reflectance upper electrode
Patent number
7,554,162
Issue date
Jun 30, 2009
NEC Corporation
Kenichi Hayashi
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR IRRADIATING LASER
Publication number
20100190276
Publication date
Jul 29, 2010
NEC Corporation
Mitsuru Nakata
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR IRRADIATING LASER
Publication number
20070249134
Publication date
Oct 25, 2007
NEC Corporation
MITSURU NAKATA
G01 - MEASURING TESTING
Information
Patent Application
Thin film transistor substrate and method of manufacture
Publication number
20050062042
Publication date
Mar 24, 2005
NEC Corporation
Kenichi Hayashi
G02 - OPTICS