Hirohiko Hayakawa

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and battery voltage monitoring device
- Patent number 10,630,067
- Issue date Apr 21, 2020
- Renesas Electronics Corporation
- Yoshitaka Muramoto
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and battery voltage monitoring device
- Patent number 9,735,567
- Issue date Aug 15, 2017
- Renesas Electronics Corporation
- Yoshitaka Muramoto
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Battery system
- Patent number 9,478,995
- Issue date Oct 25, 2016
- Renesas Electronics Corporation
- Hirohiko Hayakawa
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Switch circuit, selection circuit, and voltage measurement device
- Patent number 9,453,886
- Issue date Sep 27, 2016
- Renesas Electronics Corporation
- Ryosei Makino
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND BATTERY VOLTAGE MONITORING DEVICE
- Publication number 20170302069
- Publication date Oct 19, 2017
- RENESAS ELECTRONICS CORPORATION
- Yoshitaka MURAMOTO
- G01 - MEASURING TESTING
Information Patent Application
SWITCH CIRCUIT, SELECTION CIRCUIT, AND VOLTAGE MEASUREMENT DEVICE
- Publication number 20160377685
- Publication date Dec 29, 2016
- RENESAS ELECTRONICS CORPORATION
- Ryosei Makino
- G01 - MEASURING TESTING
Information Patent Application
BATTERY SYSTEM
- Publication number 20140266051
- Publication date Sep 18, 2014
- Renesas Electronics Corporation
- Hirohiko Hayakawa
- B60 - VEHICLES IN GENERAL
Information Patent Application
SEMICONDUCTOR DEVICE AND BATTERY VOLTAGE MONITORING DEVICE
- Publication number 20140055896
- Publication date Feb 27, 2014
- RENESAS ELECTRONICS CORPORATION
- Yoshitaka MURAMOTO
- G01 - MEASURING TESTING
Information Patent Application
SWITCH CIRCUIT, SELECTION CIRCUIT, AND VOLTAGE MEASUREMENT DEVICE
- Publication number 20140043032
- Publication date Feb 13, 2014
- RENESAS ELECTRONICS CORPORATION
- Ryosei Makino
- G01 - MEASURING TESTING