Hirohiko Kitsuki

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus
- Patent number 11,557,457
- Issue date Jan 17, 2023
- HITACHI HIGH-TECH CORPORATION
- Kosuke Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern cross-sectional shape estimation system and program
- Patent number 11,211,226
- Issue date Dec 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system, method for determining range for auto...
- Patent number 11,195,694
- Issue date Dec 7, 2021
- HITACHI HIGH-TECH CORPORATION
- Kosuke Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and calculation method for three-dimen...
- Patent number 11,164,720
- Issue date Nov 2, 2021
- HITACHI HIGH-TECH CORPORATION
- Kenji Yasui
- G01 - MEASURING TESTING
Information Patent Grant
Defect observation method and defect observation device
- Patent number 9,811,897
- Issue date Nov 7, 2017
- Hitachi High-Technologies Corporation
- Minoru Harada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged-particle microscope
- Patent number 8,859,962
- Issue date Oct 14, 2014
- Hitachi High-Technologies Corporation
- Noritsugu Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 8,153,970
- Issue date Apr 10, 2012
- Hitachi High-Technologies Corporation
- Hirohiko Kitsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 7,807,966
- Issue date Oct 5, 2010
- Hitachi High-Technologies Corporation
- Hirohiko Kitsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 7,442,929
- Issue date Oct 28, 2008
- Hitachi High-Technologies Corporation
- Hirohiko Kitsuki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DEFECT OBSERVATION METHOD, APPARATUS, AND PROGRAM
- Publication number 20230238290
- Publication date Jul 27, 2023
- HITACHI HIGH-TECH CORPORATION
- Naoaki KONDO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20220028652
- Publication date Jan 27, 2022
- HITACHI HIGH-TECH CORPORATION
- Kosuke MATSUMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System, Method for Determining Range for Auto...
- Publication number 20210166911
- Publication date Jun 3, 2021
- HITACHI HIGH-TECH CORPORATION
- Kosuke MATSUMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN CROSS-SECTIONAL SHAPE ESTIMATION SYSTEM AND PROGRAM
- Publication number 20200321189
- Publication date Oct 8, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshiyuki YOKOSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND CALCULATION METHOD FOR THREE-DIMEN...
- Publication number 20200234916
- Publication date Jul 23, 2020
- Hitachi High-Technologies Corporation
- Kenji YASUI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT OBSERVATION METHOD AND DEFECT OBSERVATION DEVICE
- Publication number 20150332445
- Publication date Nov 19, 2015
- Hitachi High-Technologies Corporation
- Minoru HARADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED-PARTICLE MICROSCOPE
- Publication number 20140197313
- Publication date Jul 17, 2014
- Hitachi High-Technologies Corporation
- Noritsugu Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE MICROSCOPE
- Publication number 20120119087
- Publication date May 17, 2012
- Hitachi High-Technologies Corporation
- Noritsugu Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20100320385
- Publication date Dec 23, 2010
- Hitachi High-Technologies Corporation
- Hirohiko Kitsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20090050805
- Publication date Feb 26, 2009
- Hitachi High-Technologies Corporation
- Hirohiko Kitsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope
- Publication number 20060226362
- Publication date Oct 12, 2006
- Hitachi High-Technologies Corporation
- Hirohiko Kitsuki
- H01 - BASIC ELECTRIC ELEMENTS

Hirohiko Kitsuki

Person

Patents Grantslast 30 patents

Charged particle beam apparatus

Pattern cross-sectional shape estimation system and program

Charged particle beam system, method for determining range for auto...

Scanning electron microscope and calculation method for three-dimen...

Defect observation method and defect observation device

Charged-particle microscope

Scanning electron microscope

Scanning electron microscope

Scanning electron microscope

Patents Applicationslast 30 patents

DEFECT OBSERVATION METHOD, APPARATUS, AND PROGRAM

Charged Particle Beam Apparatus

Charged Particle Beam System, Method for Determining Range for Auto...

PATTERN CROSS-SECTIONAL SHAPE ESTIMATION SYSTEM AND PROGRAM

SCANNING ELECTRON MICROSCOPE AND CALCULATION METHOD FOR THREE-DIMEN...

DEFECT OBSERVATION METHOD AND DEFECT OBSERVATION DEVICE

CHARGED-PARTICLE MICROSCOPE

CHARGED-PARTICLE MICROSCOPE

SCANNING ELECTRON MICROSCOPE

SCANNING ELECTRON MICROSCOPE

Scanning electron microscope