TREA

Hirohito Fujiwara

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Thermal analyzer
    • Patent number 11,460,425
    • Issue date Oct 4, 2022
    • Hitachi High-Tech Science Corporation
    • Kengo Kobayashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Thermal analyzer
    • Patent number 9,885,645
    • Issue date Feb 6, 2018
    • Hitachi High-Tech Science Corporation
    • Shinya Nishimura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Imaging apparatus for thermal analyzer and thermal analyzer includi...
    • Patent number 9,753,509
    • Issue date Sep 5, 2017
    • Hitachi High-Tech Science Corporation
    • Shinya Nishimura
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    Viscoelasticity measuring apparatus
    • Patent number 8,978,479
    • Issue date Mar 17, 2015
    • Hitachi High-Tech Science Corporation
    • Nobuaki Okubo
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Thermal analyzer
    • Patent number 8,708,556
    • Issue date Apr 29, 2014
    • SII NanoTechnology
    • Kentaro Yamada
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Differential scanning calorimeter
    • Patent number 8,342,744
    • Issue date Jan 1, 2013
    • SII NanoTechnology Inc.
    • Shinya Nishimura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic thin-section manufacturing system
    • Patent number 8,156,853
    • Issue date Apr 17, 2012
    • Seiko Instruments, Inc.
    • Hirohito Fujiwara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sectioning instrument
    • Patent number 8,087,334
    • Issue date Jan 3, 2012
    • Seiko Instruments Inc.
    • Tatsuya Miyatani
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents