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Hirohito Okuda
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Yokohama, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for inspecting defects of circuit patterns
Patent number
8,111,902
Issue date
Feb 7, 2012
Hitachi High-Technologies Corporation
Takashi Hiroi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method for classifying defects using multiple classif...
Patent number
7,873,205
Issue date
Jan 18, 2011
Hitachi High-Technologies Corporation
Hirohito Okuda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect classification using a logical equation for high stage class...
Patent number
7,756,320
Issue date
Jul 13, 2010
Hitachi High-Technologies Corporation
Toshifumi Honda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect inspection method
Patent number
7,734,082
Issue date
Jun 8, 2010
Hitachi High-Technologies Corporation
Toshifumi Honda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of classifying defects using multiple inspection machines
Patent number
7,602,962
Issue date
Oct 13, 2009
Hitachi High-Technologies Corporation
Atsushi Miyamoto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and its apparatus for classifying defects
Patent number
7,583,832
Issue date
Sep 1, 2009
Hitachi, Ltd.
Hirohito Okuda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect inspection method
Patent number
7,424,146
Issue date
Sep 9, 2008
Hitachi High-Technologies Corporation
Toshifumi Honda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method for electron beam inspection with projection e...
Patent number
7,420,167
Issue date
Sep 2, 2008
Hitachi High-Technologies Corporation
Hirohito Okuda
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for inspecting electronic circuit pattern
Patent number
7,231,079
Issue date
Jun 12, 2007
Hitachi, Ltd.
Hirohito Okuda
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection apparatus and defect inspection method
Patent number
7,205,555
Issue date
Apr 17, 2007
Hitachi, Ltd.
Hirohito Okuda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect inspection method
Patent number
7,181,060
Issue date
Feb 20, 2007
Hitachi, Ltd.
Toshifumi Honda
G01 - MEASURING TESTING
Information
Patent Grant
Method of reviewing detected defects
Patent number
7,170,593
Issue date
Jan 30, 2007
Hitachi, Ltd.
Toshifumi Honda
G01 - MEASURING TESTING
Information
Patent Grant
Method of observing a specimen using a scanning electron microscope
Patent number
7,075,077
Issue date
Jul 11, 2006
Hitachi High-Technologies Corporation
Hirohito Okuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Transmission electron microscope system and method of inspecting a...
Patent number
7,034,299
Issue date
Apr 25, 2006
Hitachi High-Technologies Corporation
Ryo Nakagaki
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of reviewing detected defects
Patent number
6,965,429
Issue date
Nov 15, 2005
Hitachi, Ltd.
Toshifumi Honda
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection apparatus and defect inspection method
Patent number
6,855,930
Issue date
Feb 15, 2005
Hitachi, Ltd.
Hirohito Okuda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method monitoring a quality of electronic circuits and its manufact...
Patent number
6,622,054
Issue date
Sep 16, 2003
Hitachi, Ltd.
Hirohito Okuda
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND SYSTEM FOR CARDIAC SCAN PLANE PRESCRIPTION
Publication number
20160169996
Publication date
Jun 16, 2016
GENERAL ELECTRIC COMPANY
Hirohito Okuda
G01 - MEASURING TESTING
Information
Patent Application
Defect Inspection Method
Publication number
20090010527
Publication date
Jan 8, 2009
Hitachi High-Technologies Corporation
Toshifumi Honda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Apparatus and method for electron beam inspection with projection e...
Publication number
20070069127
Publication date
Mar 29, 2007
Hirohito Okuda
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for inspecting defects of circuit patterns
Publication number
20070047800
Publication date
Mar 1, 2007
Takashi Hiroi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method of reviewing detected defects
Publication number
20060038986
Publication date
Feb 23, 2006
Hitachi, Ltd
Toshifumi Honda
G01 - MEASURING TESTING
Information
Patent Application
Method of observing a specimen using a scanning electron microscope
Publication number
20050194533
Publication date
Sep 8, 2005
Hirohito Okuda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Defect inspection apparatus and defect inspection method
Publication number
20050121612
Publication date
Jun 9, 2005
Hitachi, Ltd
Hirohito Okuda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Transmission electron microscope system and method of inspecting a...
Publication number
20050051725
Publication date
Mar 10, 2005
Ryo Nakagaki
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and its apparatus for classifying defects
Publication number
20040252878
Publication date
Dec 16, 2004
Hirohito Okuda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Defect classification method
Publication number
20040234120
Publication date
Nov 25, 2004
Hitachi High-Technologies Corporation
Toshifumi Honda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method of classifying defects
Publication number
20040218806
Publication date
Nov 4, 2004
Hitachi High-Technologies Corporation
Atsushi Miyamoto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Defect inspection method
Publication number
20040032979
Publication date
Feb 19, 2004
Hitachi High-Technologies Corporation
Toshifumi Honda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and its apparatus for classifying defects
Publication number
20040028276
Publication date
Feb 12, 2004
Hitachi, Ltd
Hirohito Okuda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Defect inspection apparatus and defect inspection method
Publication number
20030118149
Publication date
Jun 26, 2003
Hitachi, Ltd
Hirohito Okuda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method of reviewing detected defects
Publication number
20030058435
Publication date
Mar 27, 2003
Hitachi, Ltd
Toshifumi Honda
G01 - MEASURING TESTING
Information
Patent Application
Defect inspection method
Publication number
20030015659
Publication date
Jan 23, 2003
Hitachi, Ltd
Toshifumi Honda
G01 - MEASURING TESTING
Information
Patent Application
Method and system for inspecting electronic circuit pattern
Publication number
20020113234
Publication date
Aug 22, 2002
Hirohito Okuda
G01 - MEASURING TESTING