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Hirohito Shioya
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Anjo, JP
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last 30 patents
Information
Patent Grant
Semiconductor device employing silicon nitride layers with varied h...
Patent number
6,137,156
Issue date
Oct 24, 2000
DENSO Corporation
Yuji Ichikawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming silicon nitride with varied hydrogen concentration
Patent number
5,714,408
Issue date
Feb 3, 1998
Denso Corporation
Yuji Ichikawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor strain sensor having improved resistance to bonding s...
Patent number
5,408,112
Issue date
Apr 18, 1995
Nippondenso Co., Ltd.
Akira Tai
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for optically detecting an extraneous matter on a translu...
Patent number
4,867,561
Issue date
Sep 19, 1989
Nippondenso Co., Ltd.
Tetsuo Fujii
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Semiconductor accelerometer
Patent number
4,829,822
Issue date
May 16, 1989
Nippondenso Co., Ltd.
Masahito Imai
G01 - MEASURING TESTING