HIROJI IWATA

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HITACHINAKA-SHI, JP

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Patents Grantslast 30 patents

Information Patent Grant
Focused ion beam machining method and focused ion beam machining ap...
- Patent number 6,521,890
- Issue date Feb 18, 2003
- Hitachi, Ltd.
- Tohru Ishitani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FOCUSED ION BEAM MACHINING METHOD AND FOCUSED ION BEAM MACHINING AP...
- Publication number 20020092985
- Publication date Jul 18, 2002
- TOHRU ISHITANI
- G01 - MEASURING TESTING