Hirokazu Hayashi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
ESD protection device and manufacturing method thereof
- Patent number 8,159,033
- Issue date Apr 17, 2012
- Lapis Semiconductor Co., Ltd.
- Hirokazu Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device using SOI-substrate
- Patent number 7,859,063
- Issue date Dec 28, 2010
- Oki Semiconductor Co., Ltd.
- Hirokazu Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit
- Patent number 7,729,096
- Issue date Jun 1, 2010
- Oki Semiconductor Co., Ltd.
- Hirokazu Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Load driving device
- Patent number 7,723,794
- Issue date May 25, 2010
- Oki Semiconductor Co., Ltd.
- Toshikazu Kuroda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electro-static discharge protection circuit and semiconductor devic...
- Patent number 7,671,415
- Issue date Mar 2, 2010
- Oki Semiconductor Co., Ltd.
- Toshikazu Kuroda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having electrostatic discharge element
- Patent number 7,521,713
- Issue date Apr 21, 2009
- Oki Semiconductor Co., Ltd.
- Hirokazu Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electro-static discharge protection circuit and semiconductor devic...
- Patent number 7,498,615
- Issue date Mar 3, 2009
- Oki Electric Industry Co., Ltd.
- Toshikazu Kuroda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Design and simulation methods for electrostatic protection circuits
- Patent number 7,434,179
- Issue date Oct 7, 2008
- Oki Electric Industry Co., Ltd.
- Hirokazu Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electrostatic discharge protection device modeling method and elect...
- Patent number 7,302,378
- Issue date Nov 27, 2007
- Oki Electric Industry Co., Ltd.
- Hirokazu Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of evaluating semiconductor device
- Patent number 7,268,003
- Issue date Sep 11, 2007
- Oki Electric Industry Co., Ltd.
- Hirokazu Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Method for modeling semiconductor device process
- Patent number 7,197,439
- Issue date Mar 27, 2007
- Oki Electric Industry Co., Ltd.
- Hirokazu Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Evaluation TEG for semiconductor device and method of evaluation
- Patent number 7,000,201
- Issue date Feb 14, 2006
- Oki Electric Industry Co., Ltd.
- Hirokazu Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for modeling semiconductor device and network
- Patent number 6,981,236
- Issue date Dec 27, 2005
- Oki Electric Industry Co., Ltd.
- Hirokazu Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for modeling diffusion of impurities in a semiconductor
- Patent number 6,594,625
- Issue date Jul 15, 2003
- Oki Electric Industry Co., Ltd.
- Hirokazu Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Profile extraction method and profile extraction apparatus
- Patent number 6,581,028
- Issue date Jun 17, 2003
- Oki Electric Industry Co., Ltd.
- Hirokazu Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
SOI structure semiconductor device and a fabrication method thereof
- Patent number 6,566,712
- Issue date May 20, 2003
- Oki Electric Industry Co., Ltd.
- Hirokazu Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating a SOI structure semiconductor device
- Patent number 6,277,684
- Issue date Aug 21, 2001
- Oki Electric Industry Co., Ltd.
- Hirokazu Hayashi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CURRENCY EXCHANGE SYSTEM AND REMITTANCE SYSTEM
- Publication number 20200327612
- Publication date Oct 15, 2020
- Atom Solutions Co., Ltd.
- Hirokazu HAYASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ESD protection device and manufacturing method thereof
- Publication number 20090242993
- Publication date Oct 1, 2009
- Oki Semiconductor Co., Ltd.
- Hirokazu HAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE USING SOI-SUBSTRATE
- Publication number 20090152630
- Publication date Jun 18, 2009
- Oki Semiconductor Co., Ltd.
- Hirokazu HAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor integrated circuit
- Publication number 20080225450
- Publication date Sep 18, 2008
- Oki Electric Industry Co., Ltd.
- Hirokazu Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BREEDING SUPPORT SYSTEM
- Publication number 20080147458
- Publication date Jun 19, 2008
- Oki Electric Industry Co., Ltd.
- Akihiro Yamazaki
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
Load driving device
- Publication number 20070052033
- Publication date Mar 8, 2007
- Toshikazu Kuroda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRO-STATIC DISCHARGE PROTECTION CIRCUIT AND SEMICONDUCTOR DEVIC...
- Publication number 20060220137
- Publication date Oct 5, 2006
- Oki Electric Industry Co., Ltd.
- Toshikazu KURODA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Design and simulation methods for electrostatic protection circuits
- Publication number 20060194382
- Publication date Aug 31, 2006
- Oki Electric Industry Co., Ltd.
- Hirokazu Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor device and method of producing the same
- Publication number 20060054892
- Publication date Mar 16, 2006
- Oki Electric Industry Co., Ltd.
- Hirokazu Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of evaluating semiconductor device
- Publication number 20050196884
- Publication date Sep 8, 2005
- Hirokazu Hayashi
- G01 - MEASURING TESTING
Information Patent Application
ESD protection device modeling method and ESD simulation method
- Publication number 20050065762
- Publication date Mar 24, 2005
- Hirokazu Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for modeling semiconductor device and network
- Publication number 20040210858
- Publication date Oct 21, 2004
- Hirokazu Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Evaluation TEG for semiconductor device and method of evaluation
- Publication number 20040163071
- Publication date Aug 19, 2004
- Hirokazu Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for modeling semiconductor device process
- Publication number 20020183991
- Publication date Dec 5, 2002
- Hirokazu Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SOI structure semiconductor device and a fabrication method thereof
- Publication number 20010036710
- Publication date Nov 1, 2001
- Hirokazu Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for modeling diffusion of impurities in a semiconductor
- Publication number 20010025367
- Publication date Sep 27, 2001
- Hirokazu Hayashi
- G06 - COMPUTING CALCULATING COUNTING

Hirokazu Hayashi

Person

Patents Grantslast 30 patents

ESD protection device and manufacturing method thereof

Semiconductor device using SOI-substrate

Semiconductor integrated circuit

Load driving device

Electro-static discharge protection circuit and semiconductor devic...

Semiconductor device having electrostatic discharge element

Electro-static discharge protection circuit and semiconductor devic...

Design and simulation methods for electrostatic protection circuits

Electrostatic discharge protection device modeling method and elect...

Method of evaluating semiconductor device

Method for modeling semiconductor device process

Evaluation TEG for semiconductor device and method of evaluation

Method for modeling semiconductor device and network

Method for modeling diffusion of impurities in a semiconductor

Profile extraction method and profile extraction apparatus

SOI structure semiconductor device and a fabrication method thereof

Method of fabricating a SOI structure semiconductor device

Patents Applicationslast 30 patents

CURRENCY EXCHANGE SYSTEM AND REMITTANCE SYSTEM

ESD protection device and manufacturing method thereof

SEMICONDUCTOR DEVICE USING SOI-SUBSTRATE

Semiconductor integrated circuit

BREEDING SUPPORT SYSTEM

Load driving device

ELECTRO-STATIC DISCHARGE PROTECTION CIRCUIT AND SEMICONDUCTOR DEVIC...

Design and simulation methods for electrostatic protection circuits

Semiconductor device and method of producing the same

Method of evaluating semiconductor device

ESD protection device modeling method and ESD simulation method

Method for modeling semiconductor device and network

Evaluation TEG for semiconductor device and method of evaluation

Method for modeling semiconductor device process

SOI structure semiconductor device and a fabrication method thereof

Method for modeling diffusion of impurities in a semiconductor