Hirokazu Ito

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Circuit pattern inspecting apparatus, management system including c...
- Patent number 8,565,509
- Issue date Oct 22, 2013
- Hitachi High-Technologies Corporation
- Hiroyuki Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus
- Patent number 7,599,054
- Issue date Oct 6, 2009
- Hitachi High-Technologies Corporation
- Masayoshi Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Circuit-pattern inspecting apparatus and method
- Patent number 7,423,746
- Issue date Sep 9, 2008
- Hitachi High-Technologies Corporation
- Masayoshi Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection apparatus
- Patent number 7,355,693
- Issue date Apr 8, 2008
- Hitachi High-Technologies Corporation
- Masayoshi Takeda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT PATTERN INSPECTING APPARATUS, MANAGEMENT SYSTEM INCLUDING C...
- Publication number 20110255773
- Publication date Oct 20, 2011
- Hitachi High-Technologies Corporation
- Hiroyuki Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT-PATTERN INSPECTING APPARATUS AND METHOD
- Publication number 20080317330
- Publication date Dec 25, 2008
- Hitachi High-Technologies Corporation
- Masayoshi TAKEDA
- G01 - MEASURING TESTING
Information Patent Application
Pattern inspection apparatus
- Publication number 20080162065
- Publication date Jul 3, 2008
- HITACHI HIGH-TECNOLOGIES CORPORATION
- Masayoshi Takeda
- G01 - MEASURING TESTING
Information Patent Application
Inspection apparatus and an inspection method
- Publication number 20080099675
- Publication date May 1, 2008
- Hitachi High-Technologies Corporation
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Circuit-pattern inspecting apparatus and method
- Publication number 20070201018
- Publication date Aug 30, 2007
- Masayoshi Takeda
- G01 - MEASURING TESTING
Information Patent Application
Pattern inspection apparatus
- Publication number 20060133661
- Publication date Jun 22, 2006
- Hitachi High-Technologies Corporation
- Masayoshi Takeda
- G01 - MEASURING TESTING