Hirokazu Kaneoya

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Focused ion beam device and focused ion beam processing method
- Patent number 8,552,397
- Issue date Oct 8, 2013
- Hitachi High-Technologies Corporation
- Yuichi Madokoro
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
Focused Ion Beam Device and Focused Ion Beam Processing Method
- Publication number 20120235055
- Publication date Sep 20, 2012
- Hitachi High-Technologies Corporation
- Yuichi Madokoro
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING