Hirokazu Miyamoto

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Angle detecting apparatus and angle detecting method
- Patent number 8,258,782
- Issue date Sep 4, 2012
- TDK Corporation
- Yoshio Kaita
- G01 - MEASURING TESTING
Information Patent Grant
Angle detecting apparatus and angle detecting method
- Patent number 8,106,649
- Issue date Jan 31, 2012
- TDK Corporation
- Yoshio Kaita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Angle detecting apparatus and angle detecting method
- Publication number 20100026282
- Publication date Feb 4, 2010
- TDK Corporation
- Yoshio Kaita
- G01 - MEASURING TESTING
Information Patent Application
Angle detecting apparatus and angle detecting method
- Publication number 20100007340
- Publication date Jan 14, 2010
- TDK Corporation
- Yoshio Kaita
- G01 - MEASURING TESTING