Hirokazu SEKI

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
EUV mask inspection device, EUV mask inspection method, non-transit...
- Patent number 12,361,536
- Issue date Jul 15, 2025
- Lasertec Corporation
- Yoshihiro Kato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging apparatus
- Patent number 12,040,338
- Issue date Jul 16, 2024
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Katsuji Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging device
- Patent number 11,785,321
- Issue date Oct 10, 2023
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Katsuji Kimura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Camera module, production method, and electronic device
- Patent number 11,356,584
- Issue date Jun 7, 2022
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Yuta Momiuchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Imaging device and electronic device enabled to control position of...
- Patent number 11,330,209
- Issue date May 10, 2022
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Katsuji Kimura
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Solid-state image pickup apparatus, method of manufacturing solid-s...
- Patent number 11,177,300
- Issue date Nov 16, 2021
- Sony Corporation
- Hirokazu Seki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image sensor package with flexible printed circuits
- Patent number 11,171,170
- Issue date Nov 9, 2021
- Sony Corporation
- Yuta Momiuchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Imaging element package and camera module having a slit formed in a...
- Patent number 10,720,459
- Issue date Jul 21, 2020
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Yuta Momiuchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Defect classifying method and optical inspection apparatus for sili...
- Patent number 9,551,672
- Issue date Jan 24, 2017
- Lasertec Corporation
- Hirokazu Seki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LIGHT SOURCE APPARATUS, INSPECTION APPARATUS, EXPOSURE APPARATUS, L...
- Publication number 20250102445
- Publication date Mar 27, 2025
- Lasertec Corporation
- Ko GONDAIRA
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SOURCE APPARATUS, INSPECTION APPARATUS, EXPOSURE APPARATUS, L...
- Publication number 20250102434
- Publication date Mar 27, 2025
- Lasertec Corporation
- Mizuki KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
IMAGING DEVICE
- Publication number 20240186352
- Publication date Jun 6, 2024
- Sony Semiconductor Solutions Corporation
- Yoshiaki MASUDA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
IMAGING DEVICE AND METHOD OF MANUFACTURING IMAGING DEVICE
- Publication number 20230013088
- Publication date Jan 19, 2023
- Sony Semiconductor Solutions Corporation
- KATSUJI KIMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EUV MASK INSPECTION DEVICE, EUV MASK INSPECTION METHOD, NON-TRANSIT...
- Publication number 20220222804
- Publication date Jul 14, 2022
- Lasertec Corporation
- Yoshihiro KATO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGING DEVICE
- Publication number 20210400176
- Publication date Dec 23, 2021
- Sony Semiconductor Solutions Corporation
- KATSUJI KIMURA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
IMAGING APPARATUS
- Publication number 20210384245
- Publication date Dec 9, 2021
- Sony Semiconductor Solutions Corporation
- Katsuji Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAMERA MODULE, PRODUCTION METHOD, AND ELECTRONIC DEVICE
- Publication number 20210281721
- Publication date Sep 9, 2021
- Sony Semiconductor Solutions Corporation
- YUTA MOMIUCHI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
IMAGING DEVICE AND ELECTRONIC DEVICE
- Publication number 20210021771
- Publication date Jan 21, 2021
- Sony Semiconductor Solutions Corporation
- KATSUJI KIMURA
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
CAMERA MODULE, METHOD FOR PRODUCING CAMERA MODULE, AND ELECTRONIC A...
- Publication number 20200098810
- Publication date Mar 26, 2020
- Sony Semiconductor Solutions Corporation
- Katsuji Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING ELEMENT PACKAGE AND CAMERA MODULE
- Publication number 20190267418
- Publication date Aug 29, 2019
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- YUTA MOMIUCHI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SEMICONDUCTOR DEVICE, MANUFACTURING METHOD FOR SAME, AND ELECTRONIC...
- Publication number 20180204870
- Publication date Jul 19, 2018
- SONY CORPORATION
- YUTA MOMIUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOLID-STATE IMAGE PICKUP APPARATUS, METHOD OF MANUFACTURING SOLID-S...
- Publication number 20180083056
- Publication date Mar 22, 2018
- SONY CORPORATION
- HIROKAZU SEKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT CLASSIFYING METHOD AND INSPECTION APPARATUS
- Publication number 20150168311
- Publication date Jun 18, 2015
- Lasertec Corporation
- Hirokazu SEKI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20110242312
- Publication date Oct 6, 2011
- Lasertec Corporation
- Hirokazu SEKI
- G06 - COMPUTING CALCULATING COUNTING

Hirokazu SEKI

Person

Patents Grantslast 30 patents

EUV mask inspection device, EUV mask inspection method, non-transit...

Imaging apparatus

Imaging device

Camera module, production method, and electronic device

Imaging device and electronic device enabled to control position of...

Solid-state image pickup apparatus, method of manufacturing solid-s...

Image sensor package with flexible printed circuits

Imaging element package and camera module having a slit formed in a...

Defect classifying method and optical inspection apparatus for sili...

Patents Applicationslast 30 patents

LIGHT SOURCE APPARATUS, INSPECTION APPARATUS, EXPOSURE APPARATUS, L...

LIGHT SOURCE APPARATUS, INSPECTION APPARATUS, EXPOSURE APPARATUS, L...

IMAGING DEVICE

IMAGING DEVICE AND METHOD OF MANUFACTURING IMAGING DEVICE

EUV MASK INSPECTION DEVICE, EUV MASK INSPECTION METHOD, NON-TRANSIT...

IMAGING DEVICE

IMAGING APPARATUS

CAMERA MODULE, PRODUCTION METHOD, AND ELECTRONIC DEVICE

IMAGING DEVICE AND ELECTRONIC DEVICE

CAMERA MODULE, METHOD FOR PRODUCING CAMERA MODULE, AND ELECTRONIC A...

IMAGING ELEMENT PACKAGE AND CAMERA MODULE

SEMICONDUCTOR DEVICE, MANUFACTURING METHOD FOR SAME, AND ELECTRONIC...

SOLID-STATE IMAGE PICKUP APPARATUS, METHOD OF MANUFACTURING SOLID-S...

DEFECT CLASSIFYING METHOD AND INSPECTION APPARATUS

INSPECTION SYSTEM AND INSPECTION METHOD